YY

Yasuhiro Yoshitake

HI Hitachi: 40 patents #499 of 28,497Top 2%
HH Hitachi High-Technologies: 14 patents #211 of 1,917Top 15%
HC Hitachi Engineering Co.: 1 patents #187 of 572Top 35%
HG HGST: 1 patents #1,032 of 1,677Top 65%
HC Hitachi Instruments Engineering Co.: 1 patents #18 of 126Top 15%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
RT Renesas Technology: 1 patents #1,991 of 3,337Top 60%
ST Sandisk Technologies: 1 patents #1,320 of 2,224Top 60%
UR University Of Rochester: 1 patents #496 of 1,162Top 45%
HD Hitachi Displays: 1 patents #519 of 752Top 70%
Overall (All Time): #38,055 of 4,157,543Top 1%
61
Patents All Time

Issued Patents All Time

Showing 51–61 of 61 patents

Patent #TitleCo-InventorsDate
6334097 Method of determining lethality of defects in circuit pattern inspection method of selecting defects to be reviewed and inspection system of circuit patterns involved with the methods Masataka Shiba, Atsushi Shimoda 2001-12-25
6281024 Semiconductor device inspection and analysis method and its apparatus and a method for manufacturing a semiconductor device Kenji Watanabe, Yoshimasa Fukushima, Minori Noguchi 2001-08-28
5684565 Pattern detecting method, pattern detecting apparatus, projection exposing apparatus using the same and exposure system Yoshitada Oshida, Hisafumi Iwata, Minoru Yoshida, Yukihiro Shibata 1997-11-04
5371570 Refractive/diffractive optical system for broad-band through-the-lens imaging of alignment marks on substrates in stepper machines G. Michael Morris 1994-12-06
5324953 Reduced-projection exposure system with chromatic aberration correction system including diffractive lens such as holographic lens Yoshitada Oshida, Masataka Shiba, Yasuhiko Nakayama 1994-06-28
5164789 Method and apparatus for measuring minute displacement by subject light diffracted and reflected from a grating to heterodyne interference Yoshitada Oshida, Soichi Katagiri, Shuji Sugiyama, Yoshimitsu Saze 1992-11-17
5016149 Illuminating method and illuminating apparatus for carrying out the same, and projection exposure method and projection exposure apparatus for carrying out the same Minoru Tanaka, Yoshitada Oshida, Tetsuzo Tanimoto 1991-05-14
4993837 Method and apparatus for pattern detection Yoshitada Oshida, Naoto Nakashima, Masataka Shiba 1991-02-19
4922290 Semiconductor exposing system having apparatus for correcting change in wavelength of light source Yoshitada Oshida 1990-05-01
4862008 Method and apparatus for optical alignment of semiconductor by using a hologram Yoshitada Oshida, Naoto Nakashima 1989-08-29
4819033 Illumination apparatus for exposure Yoshitada Oshida, Masataka Shiba, Naoto Nakashima 1989-04-04