HY

Hideyuki Yamamoto

HI Hitachi: 34 patents #717 of 28,497Top 3%
HH Hitachi High-Technologies: 23 patents #72 of 1,917Top 4%
Casio Computer Co.: 16 patents #114 of 1,970Top 6%
TI Toray Industries: 3 patents #932 of 3,690Top 30%
DA Daihen: 3 patents #87 of 305Top 30%
TL Tokyo Electron Limited: 2 patents #2,602 of 5,567Top 50%
PE Pentax: 2 patents #187 of 396Top 50%
IC Iwatsu Electric Co.: 2 patents #43 of 212Top 25%
YC Yasui Seiki Co.: 1 patents #3 of 6Top 50%
IC Ishikawajima-Harima Heavy Industries Co.: 1 patents #251 of 611Top 45%
NL Nikka Limited: 1 patents #4 of 12Top 35%
NS Nippon Sanso: 1 patents #107 of 243Top 45%
OC Osaka Transformer Co.: 1 patents #4 of 15Top 30%
TT Trecenti Technologies: 1 patents #5 of 22Top 25%
Overall (All Time): #17,922 of 4,157,543Top 1%
90
Patents All Time

Issued Patents All Time

Showing 26–50 of 90 patents

Patent #TitleCo-InventorsDate
7122096 Method and apparatus for processing semiconductor Junichi Tanaka, Hiroyuki Kitsunai, Akira Kagoshima, Daisuke Shiraishi 2006-10-17
7119968 AF control apparatus Noboru Saito, Takamitsu Sasaki 2006-10-10
7107115 Method for controlling semiconductor processing apparatus Junichi Tanaka, Shoji Ikuhara, Akira Kagoshima 2006-09-12
7085827 Integrated service management system for remote customer support Takeshi Ishizaki, Shigeru Miyake, Koichiro Otani 2006-08-01
7062347 Maintenance method and system for plasma processing apparatus Toshio Masuda, Shoji Ikuhara, Akira Kagoshima, Junichi Tanaka 2006-06-13
7058470 Method of monitoring and/or controlling a semiconductor manufacturing apparatus and a system therefor Junichi Tanaka, Hiroyuki Kitsunai, Akira Kagoshima, Daisuke Shiraishi, Shoji Ikuhara +1 more 2006-06-06
7058467 Process monitoring device for sample processing apparatus and control method of sample processing apparatus Junichi Tanaka, Hiroyuki Kitsunai, Shoji Ikuhara, Kazue Takahashi 2006-06-06
7009715 Method and apparatus for determining endpoint of semiconductor element fabricating process and method and apparatus for processing member to be processed Tatehito Usui, Takashi Fujii, Motohiko Yoshigai, Tetsunori Kaji 2006-03-07
7010374 Method for controlling semiconductor processing apparatus Junichi Tanaka, Shoji Ikuhara, Akira Kagoshima 2006-03-07
6939435 Plasma processing apparatus and processing method Junichi Tanaka, Hiroyuki Kitsunai, Shoji Ikuhara, Akira Kagoshima 2005-09-06
6939433 Sample processing apparatus and sample processing system Shoji Ikuhara 2005-09-06
6923885 Plasma processing system and apparatus and a sample processing method Toshio Masuda, Tatehito Usui, Mitsuru Suehiro, Hiroshi Kanekiyo, Kazue Takahashi +1 more 2005-08-02
6916396 Etching system and etching method Akira Kagoshima, Motohiko Yoshigai, Daisuke Shiraishi, Junichi Tanaka, Kenji Tamaki +1 more 2005-07-12
6911157 Plasma processing method and apparatus using dynamic sensing of a plasma environment Manabu Edamura, Kazuyuki Ikenaga 2005-06-28
6908529 Plasma processing apparatus and method Akira Kagoshima, Shoji Ikuhara, Daisuke Shiraishi, Junichi Tanaka 2005-06-21
6903826 Method and apparatus for determining endpoint of semiconductor element fabricating process Tatehito Usui, Takashi Fujii, Motohiko Yoshigai, Tetsunori Kaji 2005-06-07
6899766 Diagnosis method for semiconductor processing apparatus Go Miya, Junichi Tanaka, Tsutomu Tetsuka 2005-05-31
6888094 Plasma processing method and plasma processing apparatus Tetsuo Ono, Katsumi Setoguchi 2005-05-03
6881352 Disturbance-free, recipe-controlled plasma processing method Akira Kagoshima, Shoji Ikuhara, Toshio Masuda, Hiroyuki Kitsunai, Junichi Tanaka +2 more 2005-04-19
6879867 Process monitoring device for sample processing apparatus and control method of sample processing apparatus Junichi Tanaka, Hiroyuki Kitsunai, Shoji Ikuhara, Kazue Takahashi 2005-04-12
6866744 Semiconductor processing apparatus and a diagnosis method therefor Go Miya, Junichi Tanaka, Tsutomu Tetsuka 2005-03-15
6844275 Heat-resistant fabric and method for production thereof Makoto Nakahara 2005-01-18
6841032 Plasma processing apparatus for adjusting plasma processing through detecting plasma processing state within chamber Shoji Ikuhara, Junichi Tanaka 2005-01-11
6830649 Apparatus and method for producing semiconductors Akira Kagoshima, Yoshimi Torii, Tatehito Usui 2004-12-14
6828165 Semiconductor plasma processing apparatus with first and second processing state monitoring units Junichi Tanaka, Hiroyuki Kitsunai, Akira Kagoshima, Daisuke Shiraishi, Shoji Ikuhara +1 more 2004-12-07