Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11519769 | Flow rate control system and flow rate measurement method | Masaaki Nagase, Masayoshi Kawashima, Masahiko TAKIMOTO, Kouji Nishino, Nobukazu Ikeda | 2022-12-06 |
| 11460869 | Fluid control system and flow rate measurement method | Yohei Sawada, Masaaki Nagase, Kouji Nishino, Nobukazu Ikeda | 2022-10-04 |
| 11402250 | Liquid level meter, vaporizer equipped with the same, and liquid level detection method | Atsushi Hidaka, Takatoshi NAKATANI, Katsuyuki Sugita, Kaoru Hirata, Masaaki Nagase +2 more | 2022-08-02 |
| 10876870 | Method of determining flow rate of a gas in a substrate processing system | Risako Miyoshi, Norihiko Amikura, Kazuyuki Miura, Masaaki Nagase, Yohei Sawada +2 more | 2020-12-29 |
| 10646844 | Vaporization supply apparatus | Atsushi Hidaka, Masaaki Nagase, Kaoru Hirata, Katsuyuki Sugita, Takatoshi NAKATANI +3 more | 2020-05-12 |
| 10604840 | Liquid level indicator and liquid raw material vaporization feeder | Atsushi Hidaka, Masaaki Nagase, Kaoru Hirata, Keiji Hirao, Kouji Nishino +1 more | 2020-03-31 |
| 9994955 | Raw material vaporization and supply apparatus | Atsushi Hidaka, Masaaki Nagase, Kouji Nishino, Nobukazu Ikeda | 2018-06-12 |
| D806031 | Flywheel for power transmission | Hiroyuki Shamoto | 2017-12-26 |
| 8724974 | Vaporizer | Tadahiro Ohmi, Yasuyuki Shirai, Masaaki Nagase, Atsushi Hidaka, Ryousuke Dohi +3 more | 2014-05-13 |
| 7096479 | Optical information recording medium | Osamu Akutsu, Masaru Hatakeyama | 2006-08-22 |
| 5778485 | Probe card cleaning apparatus, probe apparatus with the cleaning apparatus, and probe card cleaning method | Kunio Sano | 1998-07-14 |
| 5690998 | Method of coating a conductive probe needle | Yasushi Nagasawa, Masahiko Matsudo | 1997-11-25 |
| 5532613 | Probe needle | Yasushi Nagasawa, Masahiko Matsudo | 1996-07-02 |
| 5525911 | Vertical probe tester card with coaxial probes | Hiroshi Marumo, Nobuyuki Negishi, Shoichi Kanai | 1996-06-11 |
| 5378971 | Probe and a method of manufacturing the same | — | 1995-01-03 |
| 5325052 | Probe apparatus | — | 1994-06-28 |
| 5266895 | Probe with contact portion including Au and Cu alloy | — | 1993-11-30 |