Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9410884 | Component measurement device | Takashi Morita, Masami Murayama, Yoshio Nagaoka, Eiki Izumi | 2016-08-09 |
| 8206649 | Component measuring apparatus | Yoshiro Suzuki, Eiji Arita, Masakazu Ishizu, Yasuhiro Yamamoto | 2012-06-26 |
| 7586610 | Component measuring device | — | 2009-09-08 |
| 6076959 | Total-internal-reflection type deposit point sensor | — | 2000-06-20 |
| 5690998 | Method of coating a conductive probe needle | Satoru Yamashita, Masahiko Matsudo | 1997-11-25 |
| 5565978 | Total-reflection type refractive index sensor | Shuichi Okubo, Kazunari Naya | 1996-10-15 |
| 5532613 | Probe needle | Satoru Yamashita, Masahiko Matsudo | 1996-07-02 |
| 5399983 | Probe apparatus | — | 1995-03-21 |