YS

Yohei Sawada

FI Fujikin Incorporated: 18 patents #29 of 318Top 10%
RE Renesas Electronics: 7 patents #554 of 4,529Top 15%
TL Tokyo Electron Limited: 3 patents #2,069 of 5,567Top 40%
HO Hoya: 2 patents #523 of 1,290Top 45%
Overall (All Time): #105,317 of 4,157,543Top 3%
33
Patents All Time

Issued Patents All Time

Showing 1–25 of 33 patents

Patent #TitleCo-InventorsDate
12272400 Semiconductor device and semiconductor system Shinji Tanaka, Masao Morimoto 2025-04-08
11879254 Securing member and wall structure Kohei Hamada 2024-01-23
11823735 Semiconductor device 2023-11-21
11810619 Semiconductor device having a contents addressable memory Masao Morimoto, Makoto Yabuuchi 2023-11-07
D1001496 Container for contact lens 2023-10-17
D979383 Wall board attachment lug Ryohei Tatsuki 2023-02-28
11460869 Fluid control system and flow rate measurement method Satoru Yamashita, Masaaki Nagase, Kouji Nishino, Nobukazu Ikeda 2022-10-04
11339881 Valve device and fluid control device Kazunari Watanabe, Kohei Shigyou, Tomohiro Nakata, Tsutomu Shinohara 2022-05-24
11326921 Flow rate measuring method and flow rate measuring device Masaaki Nagase, Kouji Nishino, Nobukazu Ikeda 2022-05-10
11313756 Flow rate control device and abnormality detection method using flow rate control device Masaaki Nagase, Kaoru Hirata, Kouji Nishino, Nobukazu Ikeda 2022-04-26
11231598 Contact lens and method for manufacturing the same Takaharu Nakajima, Naoki Tsuji 2022-01-25
11137779 Fluid control device, method for controlling fluid control device, and fluid control system Kaoru Hirata, Katsuyuki Sugita, Masahiko TAKIMOTO, Kouji Nishino 2021-10-05
10969259 Flow rate control device, method of calibrating flow rate of flow rate control device, flow rate measuring device, and method of measuring flow rate using flow rate measuring device Masaaki Nagase, Kouji Nishino, Nobukazu Ikeda 2021-04-06
10928813 Pressure-type flow rate control device and flow rate self-diagnosis method using critical expansion condition Masaaki Nagase, Kaoru Hirata, Katsuyuki Sugita, Kouji Nishino, Nobukazu Ikeda 2021-02-23
10895484 Gas supply device capable of measuring flow rate, flowmeter, and flow rate measuring method Nobukazu Ikeda, Kouji Nishino, Masaaki Nagase 2021-01-19
10876870 Method of determining flow rate of a gas in a substrate processing system Risako Miyoshi, Norihiko Amikura, Kazuyuki Miura, Masaaki Nagase, Satoru Yamashita +2 more 2020-12-29
10706917 Semiconductor memory device Koji Nii, Yuichiro Ishii, Makoto Yabuuchi 2020-07-07
10665430 Gas supply system, substrate processing system and gas supply method Atsushi Sawachi, Norihiko Amikura, Kouji Nishino, Yoshiharu Kishida 2020-05-26
10648572 Valve with built-in orifice, and pressure-type flow rate control device Kaoru Hirata, Masaaki Nagase, Kouji Nishino, Nobukazu Ikeda 2020-05-12
10629264 Content addressable memory Makoto Yabuuchi, Masao Morimoto 2020-04-21
10453519 Semiconductor device Makoto Yabuuchi, Yuichiro Ishii 2019-10-22
10102899 Semiconductor device Makoto Yabuuchi, Yuichiro Ishii 2018-10-16
9850700 Waterproofing member and exterior wall structure 2017-12-26
9638560 Calibration method and flow rate measurement method for flow rate controller for gas supply device Masaaki Nagase, Nobukazu Ikeda, Tooru Hirai, Kazuyuki Morisaki, Kouji Nishino +1 more 2017-05-02
9507352 Variable orifice type pressure-controlled flow controller Ryousuke Dohi, Kouji Nishino, Nobukazu Ikeda 2016-11-29