JC

Jian Chen

FS Freeescale Semiconductor: 8 patents #392 of 3,767Top 15%
S( Semiconductor Manufacturing International (Beijing): 3 patents #88 of 689Top 15%
S( Semiconductor Manufacturing International (Shanghai): 3 patents #213 of 1,122Top 20%
Motorola: 2 patents #4,475 of 12,470Top 40%
AC Amtran Technology Co.: 2 patents #37 of 141Top 30%
PT Powerchip Technology: 1 patents #61 of 138Top 45%
HT Harbin Institute Of Technology: 1 patents #120 of 455Top 30%
Overall (All Time): #231,120 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDate
12384562 System and method for capturing space target Jinsheng Guo, Fan Wu, Shi Qiu, Cheng Wei, Hongxu WANG 2025-08-12
12389673 Semiconductor structure and method of forming semiconductor structure Shiliang JI, Haiyang Zhang 2025-08-12
11881480 Semiconductor structure and method of forming semiconductor structure Shiliang JI, Haiyang Zhang 2024-01-23
11439871 System and method for rehabilitation Yan Liu, Po-Jui Huang, Liang-Kai Wang, Chung-Hsien Wu 2022-09-13
11211475 Semiconductor device and formation method thereof Haiyang Zhang, Bo SU 2021-12-28
9466522 Method for fabricating semiconductor structure Ta-Chien Chiu 2016-10-11
8269912 Display device for preventing electromagnetic interference Huang-Pin Lin, Chien-Cheng Lin, Kuan-Yu Chen, Yi-An Chien, Hung-Tsai Weng 2012-09-18
8179683 Display device Huang-Pin Lin, Chien-Cheng Lin, Kuan-Yu Chen, Yi-An Chien, Hung-Tsai Weng 2012-05-15
7615806 Method for forming a semiconductor structure and structure thereof Voon-Yew Thean, Bich-Yen Nguyen, Mariam Sadaka, Da Zhang 2009-11-10
7575975 Method for forming a planar and vertical semiconductor structure having a strained semiconductor layer Voon-Yew Thean, Bich-Yen Nguyen, Mariam Sadaka, Da Zhang 2009-08-18
7288447 Semiconductor device having trench isolation for differential stress and method therefor Thien T. Nguyen, Michael D. Turner, James E. Vasek 2007-10-30
7276406 Transistor structure with dual trench for optimized stress effect and method therefor Michael D. Turner, James E. Vasek 2007-10-02
7161199 Transistor structure with stress modification and capacitive reduction feature in a width direction and method thereof Michael A. Mendicino, Vance H. Adams, Choh Fei Yeap, Venkat R. Kolagunta 2007-01-09
7125805 Method of semiconductor fabrication incorporating disposable spacer into elevated source/drain processing Rode R. Mora, Marc Rossow, Yasuhito Shiho 2006-10-24
7074713 Plasma enhanced nitride layer Stanley M. Filipiak, Yongjoo Jeon, Tab A. Stephens 2006-07-11
7064396 Integrated circuit with multiple spacer insulating region widths Vance H. Adams, Choh Fei Yeap 2006-06-20
6864135 Semiconductor fabrication process using transistor spacers of differing widths Paul A. Grudowski, Choh Fei Yeap 2005-03-08
6503814 Method for forming trench isolation Choh Fei Yeap, Franklin D. Nkansah 2003-01-07
6049114 Semiconductor device having a metal containing layer overlying a gate dielectric Bikas Maiti, Jon J. Candelaria 2000-04-11