AO

Atsushi Onishi

KT Kabushiki Kaisha Toshiba: 8 patents #3,802 of 21,451Top 20%
DI Daicel Chemical Industries: 8 patents #86 of 893Top 10%
NI Nissan Chemical Industries: 2 patents #451 of 1,150Top 40%
Toshiba Memory: 2 patents #853 of 1,971Top 45%
EB Ebara: 2 patents #752 of 1,611Top 50%
NC Nissha Co.: 1 patents #56 of 131Top 45%
NC Nissha Printing Co.: 1 patents #83 of 206Top 45%
NC Nissin Foods Holdings Co.: 1 patents #42 of 96Top 45%
IK Ishihara Sangyo Kaisha: 1 patents #244 of 403Top 65%
Overall (All Time): #176,682 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
12202224 Paper sheet fitting method and paper molded article Tetsu NISHIKAWA, Shuhei Miyashita, Hajime Nakagawa 2025-01-21
12096773 Herbicidal composition Taketo Suganuma 2024-09-24
12026869 Pavement condition rating method Toshiyuki Mori, Toshiyuki Oka, Toshiki SAKAKIBARA 2024-07-02
10943048 Defect inspection apparatus and defect inspection method Kazuhiro Nojima, Tomohide Tezuka, Kazuhiro Yamada, Shigeki Nojima, Akira Hamaguchi 2021-03-09
10750767 Non-fried potato chips Yoshifumi Miyazaki, Mitsuru Tanaka 2020-08-25
10546374 SEM inspection apparatus and pattern matching method Kazuhiro Nojima 2020-01-28
10138454 Culture container Naoko Obi, Toshihiro Iga 2018-11-27
8092677 Separating agent for an enantiomeric isomer Shinsuke Suzuki, Kazumi Suzuki 2012-01-10
8036445 Pattern matching method, program and semiconductor device manufacturing method Tadashi Mitsui, Yuichiro Yamazaki 2011-10-11
7749389 Filler used for separating optical isomers and process for separating optical isomers with the filler Koichi Murazumi, Kozo Tachibana 2010-07-06
7674570 Mask pattern inspection method, exposure condition verification method, and manufacturing method of semiconductor device Ichirota Nagahama, Yuichiro Yamazaki 2010-03-09
7645988 Substrate inspection method, method of manufacturing semiconductor device, and substrate inspection apparatus Ichirota Nagahama, Yuichiro Yamazaki 2010-01-12
7608821 Substrate inspection apparatus, substrate inspection method and semiconductor device manufacturing method Ichirota Nagahama, Yuichiro Yamazaki 2009-10-27
7550596 Method of producing ethyl (3R, 5S, 6E)-7-[2 cyclopropyl-4-(fluorophenyl) quinoline-3-yl]-3, 5-dihydroxy-6-heptenoate Kozo Tachibana 2009-06-23
7512501 Defect inspecting apparatus for semiconductor wafer Hiroyuki Morinaga, Masayoshi Yamasaki, Takema Ito, Yasuhiro Kaga 2009-03-31
7407576 Separating agent for an optical enantiomeric isomer Shinsuke Suzuki, Kazumi Suzuki 2008-08-05
7399409 Packing material for separation of optical isomer and method of separating optical isomer with the same Koichi Murazumi, Kozo Tachibana 2008-07-15
7352195 Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus Kenji Watanabe, Tohru Satake, Nobuharu Noji, Takeshi Murakami, Tsutomu Karimata +2 more 2008-04-01
7258794 Process for producing packing for resolving optical isomers Hirokazu Ikeda, Koichi Murazumi 2007-08-21
7212017 Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus Kenji Watanabe, Tohru Satake, Nobuharu Noji, Takeshi Murakami, Tsutomu Karimata +2 more 2007-05-01
7148479 Defect inspection apparatus, program, and manufacturing method of semiconductor device Yuichiro Yamazaki, Ichirota Nagahama 2006-12-12
6991729 Optical isomer separating filler, production method therefor and application method therefor Hirokazu Ikeda, Koichi Murazumi 2006-01-31
6946557 Process for producing optically active ethyl (3R, 5S, 6E)-7-[2-cycloproply-4-(4-fluorophenyl)quinolin-3-yl]-3,5-dihydroxy-6-heptenoate Koichi Murazumi, Kozo Tachibana 2005-09-20