Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10943048 | Defect inspection apparatus and defect inspection method | Kazuhiro Nojima, Atsushi Onishi, Kazuhiro Yamada, Shigeki Nojima, Akira Hamaguchi | 2021-03-09 |
TT
Tomohide Tezuka
Overall (All Time): #2,714,715 of 4,157,543Top 70%
1
Patents All Time