Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11403453 | Defect prediction | Lin Lee Cheong, Bruno La Fontaine, Marc Jurian Kea, Maxime Philippe Frederic Genin | 2022-08-02 |
| 11054754 | Methods and patterning devices and apparatuses for measuring focus performance of a lithographic apparatus, device manufacturing method | Frank Staals, Anton Bernhard Van Oosten, Carlo Cornelis Maria Luijten, Bert Verstraeten, Jan-Willem Gemmink | 2021-07-06 |
| 7622403 | Semiconductor processing system with ultra low-K dielectric | Johnny Widodo, Bei Chao Zhang, Liang-Choo Hsia | 2009-11-24 |
| 7537870 | Lithography process optimization and system | Michael M. Crouse | 2009-05-26 |