Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12360461 | Identification of hot spots or defects by machine learning | Jing Su, Yi Zou, Chenxi Lin, Stefan Hunsche, Marinus Jochemsen +1 more | 2025-07-15 |
| 12353837 | Customizable framework for natural language processing explainability | Haibo Ding, Rishita Rajal Anubhai, Muhammad Bilal Zafar, Huzefa Rangwala | 2025-07-08 |
| 12229945 | Wafer bin map based root cause analysis | Tomonori Honda, Richard Burch, Qing Zhu, Jeffrey Drue David, Michael Keleher | 2025-02-18 |
| 12124440 | Converting natural language queries to SQL queries using ontological codes and placeholders | Miguel Romero Calvo, Tesfagabir Meharizghi, Thiruvarul Selvan Senthivel, Saman Sarraf | 2024-10-22 |
| 12038802 | Collaborative learning model for semiconductor applications | Tomonori Honda, Richard Burch, John Kibarian, Qing Zhu, Vaishnavi Reddipalli +6 more | 2024-07-16 |
| 11775714 | Rational decision-making tool for semiconductor processes | Tomonori Honda, Lakshmikar Kuravi, Bogdan Cirlig | 2023-10-03 |
| 11763446 | Wafer bin map based root cause analysis | Tomonori Honda, Richard Burch, Qing Zhu, Jeffrey Drue David, Michael Keleher | 2023-09-19 |
| 11609812 | Anomalous equipment trace detection and classification | Richard Burch, Jeffrey Drue David, Qing Zhu, Tomonori Honda | 2023-03-21 |
| 11443083 | Identification of hot spots or defects by machine learning | Jing Su, Yi Zou, Chenxi Lin, Stefan Hunsche, Marinus Jochemsen +1 more | 2022-09-13 |
| 11403453 | Defect prediction | Bruno La Fontaine, Marc Jurian Kea, Yasri Yudhistira, Maxime Philippe Frederic Genin | 2022-08-02 |
| 11295993 | Maintenance scheduling for semiconductor manufacturing equipment | Tomonori Honda, Jeffrey Drue David | 2022-04-05 |
| 11126092 | Methods for determining an approximate value of a processing parameter at which a characteristic of the patterning process has a target value | Wenjin Huang, Bruno La Fontaine | 2021-09-21 |
| 11029359 | Failure detection and classsification using sensor data and/or measurement data | Tomonori Honda, Lakshmikar Kuravi | 2021-06-08 |
| 11022642 | Semiconductor yield prediction | Jeffrey Drue David, Tomonori Honda | 2021-06-01 |
| 10777470 | Selective inclusion/exclusion of semiconductor chips in accelerated failure tests | Tomonori Honda, Rohan D. Kekatpure, Lakshmikar Kuravi, Jeffrey Drue David | 2020-09-15 |