Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12229945 | Wafer bin map based root cause analysis | Lin Lee Cheong, Richard Burch, Qing Zhu, Jeffrey Drue David, Michael Keleher | 2025-02-18 |
| 12223012 | Machine learning variable selection and root cause discovery by cumulative prediction | Richard Burch, Qing Zhu, Jonathan E. Holt | 2025-02-11 |
| 12038802 | Collaborative learning model for semiconductor applications | Richard Burch, John Kibarian, Lin Lee Cheong, Qing Zhu, Vaishnavi Reddipalli +6 more | 2024-07-16 |
| 11972552 | Abnormal wafer image classification | Richard Burch, Qing Zhu, Jeffrey Drue David | 2024-04-30 |
| 11775714 | Rational decision-making tool for semiconductor processes | Lin Lee Cheong, Lakshmikar Kuravi, Bogdan Cirlig | 2023-10-03 |
| 11763446 | Wafer bin map based root cause analysis | Lin Lee Cheong, Richard Burch, Qing Zhu, Jeffrey Drue David, Michael Keleher | 2023-09-19 |
| 11609812 | Anomalous equipment trace detection and classification | Richard Burch, Jeffrey Drue David, Qing Zhu, Lin Lee Cheong | 2023-03-21 |
| 11295993 | Maintenance scheduling for semiconductor manufacturing equipment | Jeffrey Drue David, Lin Lee Cheong | 2022-04-05 |
| 11029673 | Generating robust machine learning predictions for semiconductor manufacturing processes | Rohan D. Kekatpure, Jeffrey Drue David | 2021-06-08 |
| 11029359 | Failure detection and classsification using sensor data and/or measurement data | Lin Lee Cheong, Lakshmikar Kuravi | 2021-06-08 |
| 11022642 | Semiconductor yield prediction | Jeffrey Drue David, Lin Lee Cheong | 2021-06-01 |
| 10777470 | Selective inclusion/exclusion of semiconductor chips in accelerated failure tests | Lin Lee Cheong, Rohan D. Kekatpure, Lakshmikar Kuravi, Jeffrey Drue David | 2020-09-15 |
| 10558766 | Method for Modelica-based system fault analysis at the design stage | Bhaskar Saha, Ion Matei, Daniel G. Bobrow, Johan Dekleer, William C. Janssen, Jr. +1 more | 2020-02-11 |
| 10078062 | Device health estimation by combining contextual information with sensor data | Hoda M. A. Eldardiry, Linxia Liao, Bhaskar Saha, Rui Abreu | 2018-09-18 |
| 5368665 | Method of jointing porous building plates | Akihisa Koyama, Syoji Kitahara | 1994-11-29 |