Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12055904 | Method to predict yield of a device manufacturing process | Youping Zhang, Boris Menchtchikov, Cyrus E. Tabery, Yi Zou, Chenxi Lin +2 more | 2024-08-06 |
| 12044980 | Method of manufacturing devices | Abraham SLACHTER, Wim Tjibbo Tel, Daan Maurits Slotboom, Vadim Yourievich TIMOSHKOV, Koen Wilhelmus Cornelis Adrianus Van Der Straten +7 more | 2024-07-23 |
| 12038694 | Determining pattern ranking based on measurement feedback from printed substrate | Youping Zhang, Cong Wu, Jing Su, Weixuan HU, Yi Zou | 2024-07-16 |
| 11803127 | Method for determining root cause affecting yield in a semiconductor manufacturing process | Chenxi Lin, Cyrus E. Tabery, Hakki Ergün Cekli, Simon Philip Spencer Hastings, Boris Menchtchikov +5 more | 2023-10-31 |
| 11635699 | Determining pattern ranking based on measurement feedback from printed substrate | Youping Zhang, Cong Wu, Jing Su, Weixuan HU, Yi Zou | 2023-04-25 |
| 11403453 | Defect prediction | Lin Lee Cheong, Bruno La Fontaine, Marc Jurian Kea, Yasri Yudhistira | 2022-08-02 |