Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12013647 | Metrology method | Simon Gijsbert Josephus Mathijssen, Marc Johannes Noot, Kaustuve Bhattacharyya, Arie Jeffrey Den Boef, Grzegorz Grzela +4 more | 2024-06-18 |
| 11966168 | Method of measuring variation, inspection system, computer program, and computer system | Antoine Gaston Marie Kiers, Scott Anderson Middlebrooks | 2024-04-23 |
| 11131936 | Method of measuring variation, inspection system, computer program, and computer system | Antoine Gaston Marie Kiers, Scott Anderson Middlebrooks | 2021-09-28 |
| 11054754 | Methods and patterning devices and apparatuses for measuring focus performance of a lithographic apparatus, device manufacturing method | Frank Staals, Anton Bernhard Van Oosten, Yasri Yudhistira, Carlo Cornelis Maria Luijten, Bert Verstraeten | 2021-07-06 |
| 6309781 | Photomask provided with an ESD-precluding envelope | Kees Van Hasselt | 2001-10-30 |
| 5286584 | Method of manufacturing a device and group of masks for this method | Wilhelmus H. M. Geerts, Marcel Dissel | 1994-02-15 |