Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12416870 | Measuring method and measuring apparatus | Johan REININK, Sjoerd Nicolaas Lambertus Donders, Sietse Thijmen Van Der Post | 2025-09-16 |
| 12031909 | Metrology method for measuring an exposed pattern and associated metrology apparatus | — | 2024-07-09 |
| 11982946 | Metrology targets | Nikhil Mehta, Maurits Van Der Schaar, Markus Gerardus Martinus Maria Van Kraaij, Hugo Augustinus Joseph Cramer, Olger Victor Zwier +1 more | 2024-05-14 |
| 11809088 | Method for controlling a lithographic apparatus | Hadi YAGUBIZADE, Min Seok Kim, Yingchao Cui, Daan Maurits Slotboom, Jeonghyun Park | 2023-11-07 |
| 11636247 | Three-dimensional master equation simulations of charge-carrier transport and recombination in organic semiconductor materials and devices | Reinder Coehoorn, Peter Arnold Bobbert, Feilong Liu | 2023-04-25 |
| 11366396 | Method and apparatus for configuring spatial dimensions of a beam during a scan | Daan Maurits Slotboom, Hermannes Theodorus Heijmerikx, Javier Augusto Loaiza Rivas | 2022-06-21 |
| 11137695 | Method of determining a height profile, a measurement system and a computer readable medium | Arend Johannes Donkerbroek, Thomas Theeuwes, Erik Johan Koop | 2021-10-05 |
| 10915033 | Lithographic apparatus and device manufacturing method | Bram Van Hoof | 2021-02-09 |
| 10845719 | Methods for controlling lithographic apparatus, lithographic apparatus and device manufacturing method | Rene Marinus Gerardus Johan Queens, Wolfgang Henke, Arend Johannes Donkerbroek | 2020-11-24 |