Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12086973 | Detection apparatus for simultaneous acquisition of multiple diverse images of an object | Teunis Willem Tukker, Arie Jeffrey Den Boef, Nitesh Pandey, Marinus Petrus REIJNDERS | 2024-09-10 |
| 11940739 | Metrology apparatus | Nitesh Pandey, Arie Jeffrey Den Boef, Duygu Akbulut, Marinus Johannes Maria Van Dam, Hans Butler +4 more | 2024-03-26 |
| 11694821 | Reflector and method of manufacturing a reflector | — | 2023-07-04 |
| 11262661 | Metrology apparatus | Nitesh Pandey, Arie Jeffrey Den Boef, Duygu Akbulut, Marinus Johannes Maria Van Dam, Hans Butler +4 more | 2022-03-01 |
| 11243470 | Method and apparatus for deriving corrections, method and apparatus for determining a property of a structure, device manufacturing method | Nitish Kumar, Adrianus Johannes Hendrikus Schellekens, Sietse Thijmen Van Der Post, Willem Coene, Peter Danny Van Voorst +2 more | 2022-02-08 |
| 11237484 | Metrology tools comprising aplanatic objective singlet | — | 2022-02-01 |
| 11145428 | Reflector and method of manufacturing a reflector | — | 2021-10-12 |
| 10725381 | Optical systems, metrology apparatus and associated method | Sietse Thijmen Van Der Post, Stefan Michael Bruno Bäumer, Peter Danny Van Voorst, Teunis Willem Tukker, Han-Kwang Nienhuys +1 more | 2020-07-28 |
| 10578979 | Method and apparatus for inspection and metrology | Sietse Thijmen Van Der Post, Sander Bas Roobol | 2020-03-03 |
| 10248029 | Method and apparatus for inspection and metrology | Sietse Thijmen Van Der Post, Sander Bas Roobol | 2019-04-02 |
| 10185224 | Method and apparatus for inspection and metrology | Duygu Akbulut, Peter Danny Van Voorst, Jeroen Johan Maarten Van De Wijdeven, Koos Van Berkel | 2019-01-22 |
| 10126659 | Method and apparatus for inspection and metrology | Sietse Thijmen Van Der Post, Fanhe Kong, Duygu Akbulut | 2018-11-13 |
| 9927722 | Method and apparatus for inspection and metrology | Koos Van Berkel, Duygu Akbulut, Jeroen Johan Maarten Van De Wijdeven | 2018-03-27 |
| 9811001 | Method and apparatus for inspection and metrology | Peter Danny Van Voorst, Duygu Akbulut, Koos Van Berkel, Jeroen Johan Maarten Van De Wijdeven | 2017-11-07 |
| 9748522 | Illumination system comprising beam shaping element | Coen Adrianus Verschuren | 2017-08-29 |
| 8890395 | Beamshaping optical stack, a light source and a luminaire | — | 2014-11-18 |
| 8748922 | Light output device | Maarten Marinus Johannes Wilhelmus Van Herpen | 2014-06-10 |
| 7613083 | Optical scanning device | Coen Adrianus Verschuren | 2009-11-03 |
| 6108292 | Optical scanning unit comprising a first and a second lens unit | — | 2000-08-22 |