Issued Patents All Time
Showing 1–25 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12322660 | Method and apparatus to determine a patterning process parameter | Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes +1 more | 2025-06-03 |
| 12210293 | Method for determining a measurement recipe and associated apparatuses | Wim Tjibbo Tel | 2025-01-28 |
| 12142535 | Method and apparatus to determine a patterning process parameter using a unit cell having geometric symmetry | Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes +1 more | 2024-11-12 |
| 11784098 | Method and apparatus to determine a patterning process parameter | Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes +1 more | 2023-10-10 |
| 11728224 | Method and apparatus to determine a patterning process parameter | Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes +1 more | 2023-08-15 |
| 11710668 | Method and apparatus to determine a patterning process parameter | Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes +5 more | 2023-07-25 |
| 11145557 | Method and apparatus to determine a patterning process parameter | Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes +1 more | 2021-10-12 |
| 11101184 | Method and apparatus to determine a patterning process parameter | Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes +1 more | 2021-08-24 |
| 11101185 | Method and apparatus to determine a patterning process parameter | Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes +1 more | 2021-08-24 |
| 11092900 | Method and apparatus for measuring a parameter of a lithographic process, substrate and patterning devices for use in the method | Maurits Van Der Schaar, Youping Zhang, Hendrik Jan Hidde Smilde, Anagnostis Tsiatmas, Alok Verma +3 more | 2021-08-17 |
| 10811323 | Method and apparatus to determine a patterning process parameter | Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes +5 more | 2020-10-20 |
| 10615084 | Method and apparatus to determine a patterning process parameter, associated with a change in a physical configuration, using measured pixel optical characteristic values | Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes +1 more | 2020-04-07 |
| 10546790 | Method and apparatus to determine a patterning process parameter | Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes +1 more | 2020-01-28 |
| 10542925 | Device and method for monitoring vital signs | Ihor Olehovych Kirenko, Gerard De Haan | 2020-01-28 |
| 10481503 | Method and apparatus for measuring a parameter of a lithographic process, substrate and patterning devices for use in the method | Maurits Van Der Schaar, Youping Zhang, Hendrik Jan Hidde Smilde, Anagnostis Tsiatmas, Alok Verma +3 more | 2019-11-19 |
| 10453758 | Method and apparatus to determine a patterning process parameter using an asymmetric optical characteristic distribution portion | Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes +1 more | 2019-10-22 |
| 10379446 | Lithography system, method and computer program product for hierarchical representation of two-dimensional or three-dimensional shapes | Alok Verma, Sinatra Canggih KHO | 2019-08-13 |
| 10369752 | Metrology method and apparatus, computer program and lithographic system | Seyed Iman Mossavat | 2019-08-06 |
| 9760018 | Method and inspection apparatus and computer program product for assessing a quality of reconstruction of a value of a parameter of interest of a structure | Seyed Iman Mossavat, Hugo Augustinus Joseph Cramer, Willem Jan Grootjans | 2017-09-12 |
| 9524548 | Method and system for obtaining a first signal for analysis to characterize at least one periodic component thereof | Ihor Olehovych Kirenko, Vincent Jeanne, Gerard De Haan | 2016-12-20 |
| 9384727 | Active sound reduction system and method | Paul Sebastian Booij, Ronaldus Maria Aarts | 2016-07-05 |
| 9241674 | Distortion reduced signal detection | — | 2016-01-26 |
| 9165549 | Audio noise cancelling | — | 2015-10-20 |
| 9124777 | Device and method for extracting information from characteristic signals | Gerard De Haan, Willem Verkruijsse | 2015-09-01 |
| 8948410 | Active audio noise cancelling | — | 2015-02-03 |