YJ

Young-Chang Joo

AM AMD: 9 patents #1,329 of 9,279Top 15%
SF Seoul National University R&Db Foundation: 5 patents #70 of 2,771Top 3%
UN Unknown: 3 patents #7,366 of 83,584Top 9%
Samsung: 3 patents #30,683 of 75,807Top 45%
SF Snu R&Db Foundation: 2 patents #164 of 1,470Top 15%
SF Seoul National University Industry Foundation: 1 patents #226 of 804Top 30%
KT Korea Institute Of Science And Technology: 1 patents #1,479 of 3,491Top 45%
Overall (All Time): #235,182 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11850805 Method for manufacturing PDMS device and PDMS device manufactured thereby Taek Dong Chung, Jeong-Yun Sun, Seok-Hee Han, Sung-Il Kim, Hae-Ryung Lee +1 more 2023-12-26
11525189 Method of manufacturing MoS2 having 1T crystal structure Won Hyo Joo, Dae Hyun Nam, Ji Yong Kim 2022-12-13
11474069 Open-junction ionic transistor Jeong-Yun Sun, Taek Dong Chung, Hae-Ryung Lee, Seung-Min Lim, Seok-Hee Han +1 more 2022-10-18
11008673 Chalcogenide-carbon nanofiber and preparation method therefor Dae Hyun Nam 2021-05-18
10682698 Metal-carbon nanofiber and production method thereof Dae Hyun Nam, Ji Hoon Lee, Na Rae Kim, Yoo Yong Lee, Han-Wool YEON +1 more 2020-06-16
9510445 Member for flexible element and manufacturing method thereof In Suk Choi, Myoung Woon Moon, Byoung Joon Kim, Min Suk Jung 2016-11-29
8410373 Printed circuit substrate and method of manufacturing the same Hyung Wook Park, Hong Seok Min, Young Gwan Ko, Chang-Sup Ryu, Ho Young Lee +2 more 2013-04-02
8216635 Method of forming metal wiring and metal wiring formed using the same Young Ah Song, Ji Hoon Lee, Seol Min Yi, Jae-Woo Joung, Sung I. Oh +2 more 2012-07-10
7929330 Multi-bit memory device using multi-plug Deok-kee Kim, Ha-young You, Jung-hun Sung, Soo-Jung Hwang, Sung-yup Jung 2011-04-19
6821901 Method of through-etching substrate Seung Jin Song, Kyoungdoug Min, Hong Seok Min, Sejun Kim, Kun-joong Park 2004-11-23
6633083 Barrier layer integrity test Christy Mei-Chu Woo, Todd P. Lukanc 2003-10-14
6348701 Method for determining metal concentration in a field area Amit P. Marathe 2002-02-19
6339958 Adhesion strength testing using a depth-sensing indentation technique Ting Tsui 2002-01-22
6242349 Method of forming copper/copper alloy interconnection with reduced electromigration Takeshi Nogami, Sergey Lopatin 2001-06-05
6242924 Method for electronically measuring size of internal void in electrically conductive lead Tsui Ting Yiu, Yow-Juang Liu, Sunil N. Shabde 2001-06-05
6228768 Storage-annealing plated CU interconnects Christy Mei-Chu Woo 2001-05-08
6124203 Method for forming conformal barrier layers Dirk Brown, Simon S. Chan 2000-09-26
6121141 Method of forming a void free copper interconnects Christy Mei-Chu Woo, Dirk Brown, Imran Hashim 2000-09-19
6053034 Method for measuring fracture toughness of thin films Ting Tsui 2000-04-25