Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6242924 | Method for electronically measuring size of internal void in electrically conductive lead | Yow-Juang Liu, Young-Chang Joo, Sunil N. Shabde | 2001-06-05 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6242924 | Method for electronically measuring size of internal void in electrically conductive lead | Yow-Juang Liu, Young-Chang Joo, Sunil N. Shabde | 2001-06-05 |