Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6407558 | Method of determining the doping concentration across a surface of a semiconductor material | Yowjuang W. Liu, Ting Tsui | 2002-06-18 |
| 6348356 | Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors | Richard C. Blish, II, Donald L. Wollesen | 2002-02-19 |
| 6320403 | Method of determining the doping concentration and defect profile across a surface of a processed semiconductor material | Yowjuang W. Liu, Ting Tsui | 2001-11-20 |
| 6242924 | Method for electronically measuring size of internal void in electrically conductive lead | Tsui Ting Yiu, Yow-Juang Liu, Young-Chang Joo | 2001-06-05 |
| 6216099 | Test system and methodology to improve stacked NAND gate based critical path performance and reliability | Peng Fang | 2001-04-10 |
| 6211692 | Method and apparatus for determining the robustness and incident angle sensitivity of memory cells to alpha-particle/cosmic ray induced soft errors | Yowjuang W. Liu | 2001-04-03 |
| 6208154 | Method of determining the doping concentration across a surface of a semiconductor material | Yowjuang W. Liu, Ting Tsui | 2001-03-27 |
| 6204516 | Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors | Richard C. Blish, II, Donald L. Wollesen | 2001-03-20 |
| 6177802 | System and method for detecting defects in an interlayer dielectric of a semiconductor device using the hall-effect | Yowjuang W. Liu, Ting Tsui | 2001-01-23 |
| 6147507 | System and method of mapping leakage current and a defect profile of a semiconductor dielectric layer | Yowjuang W. Liu, Ting Tsui | 2000-11-14 |
| 6023327 | System and method for detecting defects in an interlayer dielectric of a semiconductor device | Yowjuang W. Liu, Ting Tsui | 2000-02-08 |
| 5999465 | Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors | Yowjuang W. Liu, Donald L. Wollesen | 1999-12-07 |
| 5982691 | Method and apparatus for determining the robustness of memory cells to induced soft errors using equivalent diodes | Donald L. Wollesen | 1999-11-09 |