Sunil N. Shabde — 13 Patents at AMD

Sunil N. Shabde has been granted 13 US patents while listed as an inventor at AMD. The first was granted in 1999 and the most recent in June 2002. Sunil N. Shabde ranks #362,438 of 4,157,543 US inventors in our database (top 8.7%). Patent records list Sunil N. Shabde in Cupertino, CA, US.

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
6407558	Method of determining the doping concentration across a surface of a semiconductor material	Yowjuang W. Liu, Ting Tsui	2002-06-18	$3,499,000
6348356	Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors	Richard C. Blish, II, Donald L. Wollesen	2002-02-19	$5,378,000
6320403	Method of determining the doping concentration and defect profile across a surface of a processed semiconductor material	Yowjuang W. Liu, Ting Tsui	2001-11-20	$3,380,000
6242924	Method for electronically measuring size of internal void in electrically conductive lead	Tsui Ting Yiu, Yow-Juang Liu, Young-Chang Joo	2001-06-05	$7,807,000
6216099	Test system and methodology to improve stacked NAND gate based critical path performance and reliability	Peng Fang	2001-04-10	$6,300,000
6211692	Method and apparatus for determining the robustness and incident angle sensitivity of memory cells to alpha-particle/cosmic ray induced soft errors	Yowjuang W. Liu	2001-04-03	$5,058,000
6208154	Method of determining the doping concentration across a surface of a semiconductor material	Yowjuang W. Liu, Ting Tsui	2001-03-27	$5,495,000
6204516	Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors	Richard C. Blish, II, Donald L. Wollesen	2001-03-20	$7,513,000
6177802	System and method for detecting defects in an interlayer dielectric of a semiconductor device using the hall-effect	Yowjuang W. Liu, Ting Tsui	2001-01-23	$6,489,000
6147507	System and method of mapping leakage current and a defect profile of a semiconductor dielectric layer	Yowjuang W. Liu, Ting Tsui	2000-11-14	$4,365,000
6023327	System and method for detecting defects in an interlayer dielectric of a semiconductor device	Yowjuang W. Liu, Ting Tsui	2000-02-08	$8,952,000
5999465	Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors	Yowjuang W. Liu, Donald L. Wollesen	1999-12-07	$5,732,000
5982691	Method and apparatus for determining the robustness of memory cells to induced soft errors using equivalent diodes	Donald L. Wollesen	1999-11-09	$2,369,000

Sunil N. Shabde — 13 Patents

Issued Patents All Time

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