| 6407558 |
Method of determining the doping concentration across a surface of a semiconductor material |
Yowjuang W. Liu, Ting Tsui |
2002-06-18 |
| 6348356 |
Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors |
Richard C. Blish, II, Donald L. Wollesen |
2002-02-19 |
| 6320403 |
Method of determining the doping concentration and defect profile across a surface of a processed semiconductor material |
Yowjuang W. Liu, Ting Tsui |
2001-11-20 |
| 6242924 |
Method for electronically measuring size of internal void in electrically conductive lead |
Tsui Ting Yiu, Yow-Juang Liu, Young-Chang Joo |
2001-06-05 |
| 6216099 |
Test system and methodology to improve stacked NAND gate based critical path performance and reliability |
Peng Fang |
2001-04-10 |
| 6211692 |
Method and apparatus for determining the robustness and incident angle sensitivity of memory cells to alpha-particle/cosmic ray induced soft errors |
Yowjuang W. Liu |
2001-04-03 |
| 6208154 |
Method of determining the doping concentration across a surface of a semiconductor material |
Yowjuang W. Liu, Ting Tsui |
2001-03-27 |
| 6204516 |
Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors |
Richard C. Blish, II, Donald L. Wollesen |
2001-03-20 |
| 6177802 |
System and method for detecting defects in an interlayer dielectric of a semiconductor device using the hall-effect |
Yowjuang W. Liu, Ting Tsui |
2001-01-23 |
| 6147507 |
System and method of mapping leakage current and a defect profile of a semiconductor dielectric layer |
Yowjuang W. Liu, Ting Tsui |
2000-11-14 |
| 6023327 |
System and method for detecting defects in an interlayer dielectric of a semiconductor device |
Yowjuang W. Liu, Ting Tsui |
2000-02-08 |
| 5999465 |
Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors |
Yowjuang W. Liu, Donald L. Wollesen |
1999-12-07 |
| 5982691 |
Method and apparatus for determining the robustness of memory cells to induced soft errors using equivalent diodes |
Donald L. Wollesen |
1999-11-09 |