Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| D1039167 | Radiopharmaceutical synthesis device | Shanyou YU, Xuan Lv, Chenglong YAN | 2024-08-13 |
| D1022246 | Waste gas treatment device for radiopharmaceutical synthesis | Shanyou YU, Xuan Lv, Chenglong YAN | 2024-04-09 |
| 10015848 | Primary side controlled LED driver with ripple cancellation | Yan-Fei Liu | 2018-07-03 |
| 9917524 | Energy channelling single stage power converter | Yan-Fei Liu | 2018-03-13 |
| 8788252 | Multi-well time-lapse nodal analysis of transient production systems | Wentao Zhou, Raj Banerjee, Eduardo Proano, Ji Li, Yinli Wang +4 more | 2014-07-22 |
| 6216099 | Test system and methodology to improve stacked NAND gate based critical path performance and reliability | Sunil N. Shabde | 2001-04-10 |
| 6180441 | Bar field effect transistor | John T. Yue, Matthew S. Buynoski, Yowjuang W. Liu | 2001-01-30 |
| 6143632 | Deuterium doping for hot carrier reliability improvement | Emi Ishida | 2000-11-07 |
| 6140186 | Method of forming asymmetrically doped source/drain regions | Ming-Ren Lin, Donald L. Wollesen | 2000-10-31 |
| 6133746 | Method for determining a reliable oxide thickness | Hao Fang | 2000-10-17 |
| 6043102 | Assessing plasma induced gate dielectric degradation with stress induced leakage current measurements | Jiang Tao | 2000-03-28 |
| 6023100 | Metallization stack structure to improve electromigration resistance and keep low resistivity of ULSI interconnects | Jiang Tao | 2000-02-08 |
| 5994776 | Interlevel dielectric with multiple air gaps between conductive lines of an integrated circuit | Homi Fatemi | 1999-11-30 |
| 5932911 | Bar field effect transistor | John T. Yue, Matthew S. Buynoski, Yowjuang W. Liu | 1999-08-03 |
| 5904528 | Method of forming asymmetrically doped source/drain regions | Ming-Ren Lin, Donald L. Wollesen | 1999-05-18 |
| 5891802 | Method for fabricating a metallization stack structure to improve electromigration resistance and keep low resistivity of ULSI interconnects | Jiang Tao | 1999-04-06 |
| 5606518 | Test method for predicting hot-carrier induced leakage over time in short-channel IGFETS and products designed in accordance with test results | Hao Fang, John T. Yue | 1997-02-25 |
| 5600578 | Test method for predicting hot-carrier induced leakage over time in short-channel IGFETs and products designed in accordance with test results | Hao Fang, John T. Yue | 1997-02-04 |