Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
PF

Peng Fang — 19 Patents

AMD: 13 patents #915 of 9,280Top 10%
QKQueen'S University At Kingston: 2 patents #115 of 506Top 25%
Schlumberger Technology: 1 patents #3,946 of 7,293Top 55%
Kingston, CA: #21 of 799 inventorsTop 3%
Overall (All Time): #229,345 of 4,157,543Top 6%
19 Patents All Time
Peng Fang has been granted 19 US patents while listed as an inventor at AMD. The first was granted in 1997 and the most recent in December 2025. Peng Fang ranks #229,345 of 4,157,543 US inventors in our database (top 5.5%). Patent records list Peng Fang in Kingston, ON, CA.

Patents per Year

Patents granted per year, 1997 to 2024Bar chart with a peak of 5 patents in 2000.peak 51997: 2 patents19971999: 4 patents19992000: 5 patents20002001: 2 patents20012014: 1 patents20142018: 2 patents20182024: 2 patents2024

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12506406 Input stage for a power converter 2025-12-23
D1039167 Radiopharmaceutical synthesis device Shanyou YU, Xuan Lv, Chenglong YAN 2024-08-13
D1022246 Waste gas treatment device for radiopharmaceutical synthesis Shanyou YU, Xuan Lv, Chenglong YAN 2024-04-09
10015848 Primary side controlled LED driver with ripple cancellation Yan-Fei Liu 2018-07-03
9917524 Energy channelling single stage power converter Yan-Fei Liu 2018-03-13
8788252 Multi-well time-lapse nodal analysis of transient production systems Wentao Zhou, Raj Banerjee, Eduardo Proano, Ji Li, Yinli Wang +4 more 2014-07-22 $35,758,000
6216099 Test system and methodology to improve stacked NAND gate based critical path performance and reliability Sunil N. Shabde 2001-04-10 $6,300,000
6180441 Bar field effect transistor John T. Yue, Matthew S. Buynoski, Yowjuang W. Liu 2001-01-30 $6,431,000
6143632 Deuterium doping for hot carrier reliability improvement Emi Ishida 2000-11-07 $6,155,000
6140186 Method of forming asymmetrically doped source/drain regions Ming-Ren Lin, Donald L. Wollesen 2000-10-31 $4,395,000
6133746 Method for determining a reliable oxide thickness Hao Fang 2000-10-17 $7,276,000
6043102 Assessing plasma induced gate dielectric degradation with stress induced leakage current measurements Jiang Tao 2000-03-28 $9,076,000
6023100 Metallization stack structure to improve electromigration resistance and keep low resistivity of ULSI interconnects Jiang Tao 2000-02-08 $8,952,000
5994776 Interlevel dielectric with multiple air gaps between conductive lines of an integrated circuit Homi Fatemi 1999-11-30 $2,801,000
5932911 Bar field effect transistor John T. Yue, Matthew S. Buynoski, Yowjuang W. Liu 1999-08-03 $2,588,000
5904528 Method of forming asymmetrically doped source/drain regions Ming-Ren Lin, Donald L. Wollesen 1999-05-18 $2,666,000
5891802 Method for fabricating a metallization stack structure to improve electromigration resistance and keep low resistivity of ULSI interconnects Jiang Tao 1999-04-06 $2,671,000
5606518 Test method for predicting hot-carrier induced leakage over time in short-channel IGFETS and products designed in accordance with test results Hao Fang, John T. Yue 1997-02-25 $14,795,000
5600578 Test method for predicting hot-carrier induced leakage over time in short-channel IGFETs and products designed in accordance with test results Hao Fang, John T. Yue 1997-02-04 $13,750,000