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Apparatus and method for testing image sensor wafers to identify pixel defects |
Chia-Lun Chang, Chih-huei Wu |
2011-08-16 |
| 6180441 |
Bar field effect transistor |
Matthew S. Buynoski, Yowjuang W. Liu, Peng Fang |
2001-01-30 |
| 5932911 |
Bar field effect transistor |
Matthew S. Buynoski, Yowjuang W. Liu, Peng Fang |
1999-08-03 |
| 5923063 |
Double density V nonvolatile memory cell |
Yowjuang W. Liu, Donald L. Wollesen |
1999-07-13 |
| 5786705 |
Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems |
Nguyen Duc Bui, Van-Hung Pham |
1998-07-28 |
| 5612627 |
Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems |
Nguyen Duc Bui, Van-Hung Pham |
1997-03-18 |
| 5606518 |
Test method for predicting hot-carrier induced leakage over time in short-channel IGFETS and products designed in accordance with test results |
Hao Fang, Peng Fang |
1997-02-25 |
| 5600578 |
Test method for predicting hot-carrier induced leakage over time in short-channel IGFETs and products designed in accordance with test results |
Hao Fang, Peng Fang |
1997-02-04 |
| 5504017 |
Void detection in metallization patterns |
Shekhar Pramanick |
1996-04-02 |