Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8000520 | Apparatus and method for testing image sensor wafers to identify pixel defects | Chia-Lun Chang, Chih-huei Wu | 2011-08-16 |
| 6180441 | Bar field effect transistor | Matthew S. Buynoski, Yowjuang W. Liu, Peng Fang | 2001-01-30 |
| 5932911 | Bar field effect transistor | Matthew S. Buynoski, Yowjuang W. Liu, Peng Fang | 1999-08-03 |
| 5923063 | Double density V nonvolatile memory cell | Yowjuang W. Liu, Donald L. Wollesen | 1999-07-13 |
| 5786705 | Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems | Nguyen Duc Bui, Van-Hung Pham | 1998-07-28 |
| 5612627 | Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems | Nguyen Duc Bui, Van-Hung Pham | 1997-03-18 |
| 5606518 | Test method for predicting hot-carrier induced leakage over time in short-channel IGFETS and products designed in accordance with test results | Hao Fang, Peng Fang | 1997-02-25 |
| 5600578 | Test method for predicting hot-carrier induced leakage over time in short-channel IGFETs and products designed in accordance with test results | Hao Fang, Peng Fang | 1997-02-04 |
| 5504017 | Void detection in metallization patterns | Shekhar Pramanick | 1996-04-02 |