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Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
JY

John T. Yue — 9 Patents

AMD: 8 patents #1,550 of 9,280Top 20%
OTOmnivision Technologies: 1 patents #379 of 604Top 65%
Los Altos, CA: #1,107 of 3,651 inventorsTop 35%
California: #67,547 of 386,348 inventorsTop 20%
Overall (All Time): #535,341 of 4,157,543Top 15%
9 Patents All Time
John T. Yue has been granted 9 US patents while listed as an inventor at AMD. The first was granted in 1996 and the most recent in August 2011. John T. Yue ranks #535,341 of 4,157,543 US inventors in our database (top 12.9%). Patent records list John T. Yue in Los Altos, CA, US.

Patents per Year

Patents granted per year, 1996 to 2011Bar chart with a peak of 3 patents in 1997.peak 31996: 1 patents19961997: 3 patents19971998: 1 patents19981999: 2 patents19992001: 1 patents20012011: 1 patents2011

Issued Patents All Time

Showing 1–9 of 9 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
8000520 Apparatus and method for testing image sensor wafers to identify pixel defects Chia-Lun Chang, Chih-huei Wu 2011-08-16 $6,695,000
6180441 Bar field effect transistor Matthew S. Buynoski, Yowjuang W. Liu, Peng Fang 2001-01-30 $6,431,000
5932911 Bar field effect transistor Matthew S. Buynoski, Yowjuang W. Liu, Peng Fang 1999-08-03 $2,588,000
5923063 Double density V nonvolatile memory cell Yowjuang W. Liu, Donald L. Wollesen 1999-07-13 $2,323,000
5786705 Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems Nguyen Duc Bui, Van-Hung Pham 1998-07-28 $4,419,000
5612627 Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems Nguyen Duc Bui, Van-Hung Pham 1997-03-18 $11,685,000
5606518 Test method for predicting hot-carrier induced leakage over time in short-channel IGFETS and products designed in accordance with test results Hao Fang, Peng Fang 1997-02-25 $14,795,000
5600578 Test method for predicting hot-carrier induced leakage over time in short-channel IGFETs and products designed in accordance with test results Hao Fang, Peng Fang 1997-02-04 $13,750,000
5504017 Void detection in metallization patterns Shekhar Pramanick 1996-04-02 $7,281,000