Nguyen Duc Bui — 21 Patents at AMD

Nguyen Duc Bui has been granted 21 US patents while listed as an inventor at AMD. The first was granted in 1997 and the most recent in April 2022. Nguyen Duc Bui ranks #201,324 of 4,157,543 US inventors in our database (top 4.8%). Patent records list Nguyen Duc Bui in San Jose, CA, US.

Issued Patents All Time

Showing 1–21 of 21 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
11295825	Multi-time programmable non-volatile memory cell	Farrokh Omid-Zohoor, Binh Ly	2022-04-05	$68,442,000
10217521	Multi-time programmable non-volatile memory cell	Farrokh Omid-Zohoor, Binh Ly	2019-02-26	$17,560,000
6703305	Semiconductor device having metallized interconnect structure and method of fabrication	Farrokh Omid-Zohoor	2004-03-09	$5,511,000
6700154	EEPROM cell with trench coupling capacitor	Dainius A. Vidmantas, Richard Smoak	2004-03-02	$3,864,000
6472233	MOSFET test structure for capacitance-voltage measurements	Khaled Ahmed, Effiong Ibok, John R. Hauser	2002-10-29	$1,498,000
6413820	Method of forming a composite interpoly gate dielectric	—	2002-07-02	$3,406,000
6329831	Method and apparatus for reliability testing of integrated circuit structures and devices	Michael Anthony Niederhofer, Van-Hung Pham	2001-12-11	$6,262,000
6320391	Interconnection device for low and high current stress electromigration and correlation study	—	2001-11-20	$3,380,000
6163049	Method of forming a composite interpoly gate dielectric	—	2000-12-19	$3,857,000
6100101	Sensitive technique for metal-void detection	Amit P. Marathe, Van-Hung Pham	2000-08-08	$4,885,000
6063662	Methods for forming a control gate apparatus in non-volatile memory semiconductor devices	—	2000-05-16	$14,024,000
6005409	Detection of process-induced damage on transistors in real time	Chenming Hu, Donggun Park, Scott Zheng	1999-12-21	$3,429,000
5966024	Sensitive method of evaluating process induced damage in MOSFETs using a differential amplifier operational principle	Scott Zheng	1999-10-12	$2,065,000
5808361	Intergrated circuit interconnect via structure having low resistance	—	1998-09-15	$3,221,000
5786705	Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems	John T. Yue, Van-Hung Pham	1998-07-28	$4,419,000
5726458	Hot carrier injection test structure and technique for statistical evaluation	—	1998-03-10	$9,720,000
5712510	Reduced electromigration interconnection line	Donald L. Wollesen	1998-01-27	$6,963,000
5689139	Enhanced electromigration lifetime of metal interconnection lines	Donald L. Wollesen	1997-11-18	$9,424,000
5650651	Plasma damage reduction device for sub-half micron technology	—	1997-07-22	$8,310,000
5612627	Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems	John T. Yue, Van-Hung Pham	1997-03-18	$11,685,000
5598009	Hot carrier injection test structure and testing technique for statistical evaluation	—	1997-01-28	$5,134,000

Nguyen Duc Bui — 21 Patents

Issued Patents All Time

Patent Widget