Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11295825 | Multi-time programmable non-volatile memory cell | Farrokh Omid-Zohoor, Binh Ly | 2022-04-05 |
| 10217521 | Multi-time programmable non-volatile memory cell | Farrokh Omid-Zohoor, Binh Ly | 2019-02-26 |
| 6703305 | Semiconductor device having metallized interconnect structure and method of fabrication | Farrokh Omid-Zohoor | 2004-03-09 |
| 6700154 | EEPROM cell with trench coupling capacitor | Dainius A. Vidmantas, Richard Smoak | 2004-03-02 |
| 6472233 | MOSFET test structure for capacitance-voltage measurements | Khaled Ahmed, Effiong Ibok, John R. Hauser | 2002-10-29 |
| 6413820 | Method of forming a composite interpoly gate dielectric | — | 2002-07-02 |
| 6329831 | Method and apparatus for reliability testing of integrated circuit structures and devices | Michael Anthony Niederhofer, Van-Hung Pham | 2001-12-11 |
| 6320391 | Interconnection device for low and high current stress electromigration and correlation study | — | 2001-11-20 |
| 6163049 | Method of forming a composite interpoly gate dielectric | — | 2000-12-19 |
| 6100101 | Sensitive technique for metal-void detection | Amit P. Marathe, Van-Hung Pham | 2000-08-08 |
| 6063662 | Methods for forming a control gate apparatus in non-volatile memory semiconductor devices | — | 2000-05-16 |
| 6005409 | Detection of process-induced damage on transistors in real time | Chenming Hu, Donggun Park, Scott Zheng | 1999-12-21 |
| 5966024 | Sensitive method of evaluating process induced damage in MOSFETs using a differential amplifier operational principle | Scott Zheng | 1999-10-12 |
| 5808361 | Intergrated circuit interconnect via structure having low resistance | — | 1998-09-15 |
| 5786705 | Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems | John T. Yue, Van-Hung Pham | 1998-07-28 |
| 5726458 | Hot carrier injection test structure and technique for statistical evaluation | — | 1998-03-10 |
| 5712510 | Reduced electromigration interconnection line | Donald L. Wollesen | 1998-01-27 |
| 5689139 | Enhanced electromigration lifetime of metal interconnection lines | Donald L. Wollesen | 1997-11-18 |
| 5650651 | Plasma damage reduction device for sub-half micron technology | — | 1997-07-22 |
| 5612627 | Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems | John T. Yue, Van-Hung Pham | 1997-03-18 |
| 5598009 | Hot carrier injection test structure and testing technique for statistical evaluation | — | 1997-01-28 |