Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6005409 | Detection of process-induced damage on transistors in real time | Nguyen Duc Bui, Chenming Hu, Donggun Park | 1999-12-21 |
| 5966024 | Sensitive method of evaluating process induced damage in MOSFETs using a differential amplifier operational principle | Nguyen Duc Bui | 1999-10-12 |