MN

Michael Anthony Niederhofer

AM AMD: 1 patents #5,683 of 9,279Top 65%
Overall (All Time): #3,602,364 of 4,157,543Top 90%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6329831 Method and apparatus for reliability testing of integrated circuit structures and devices Nguyen Duc Bui, Van-Hung Pham 2001-12-11