Issued Patents All Time
Showing 51–65 of 65 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9679187 | Finger biometric sensor assembly including direct bonding interface and related methods | Patrick E. O'Brien, Jun Zhai, Dale R. Setlak, David D. Coons, Kwan-Yu Lai | 2017-06-13 |
| 9305959 | Biometric sensor chip having distributed sensor and control circuitry | Jun Zhai | 2016-04-05 |
| 9287189 | Flexible routing for chip on board applications | Javed Iqbal Sandhu, Rezaur Rahman Khan, Teck Yang Tan | 2016-03-15 |
| 9236442 | Integration of chips and silicon-based trench capacitors using low parasitic silicon-level connections | Sampath Komarapalayam Velayudham Karikalan, Rezaur Rahman Khan | 2016-01-12 |
| 9123698 | Flexural plate wave device for chip cooling | Seyed Mahdi Saeidi, Tak Sang Yeung | 2015-09-01 |
| 8817472 | Methods and systems for on-chip osmotic airflow cooling | Sam Ziqun Zhao | 2014-08-26 |
| 8593155 | MEMS in-plane resonators | Andrew Sparks | 2013-11-26 |
| 8267745 | Methods of grinding semiconductor wafers having improved nanotopology | Puneet Gupta, Roland R. Vandamme, Takuto Kazama, Noriyuki Tachi | 2012-09-18 |
| 8066553 | Wafer clamping device for a double side grinder | Puneet Gupta, Roland R. Vandamme, Takuto Kazama, Noriyuki Tachi | 2011-11-29 |
| 8058144 | Method for capping a MEMS wafer | Erik Tarvin, Firas Sammoura, Kuang L. Yang, Andrew Sparks | 2011-11-15 |
| 7981723 | Capped wafer method and apparatus | Xue'en Yang, Erik Tarvin | 2011-07-19 |
| 7927185 | Method for assessing workpiece nanotopology using a double side wafer grinder | Roland R. Vandamme | 2011-04-19 |
| 7662023 | Double side wafer grinder and methods for assessing workpiece nanotopology | Ronald D. Vandamme | 2010-02-16 |
| 7601049 | Double side wafer grinder and methods for assessing workpiece nanotopology | Sumeet S. Bhagavat, Roland R. Vandamme, Tomomi Komura | 2009-10-13 |
| 6613591 | Method of estimating post-polishing waviness characteristics of a semiconductor wafer | Yun-Biao Xin, Gary L. Anderson, Brent Teasley | 2003-09-02 |