Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6967873 | Memory device and method using positive gate stress to recover overerased cell | Darlene Hamilton, Zhizheng Liu, Mark Randolph, Yi He, Kulachet Tanpairoj +2 more | 2005-11-22 |
| 6956768 | Method of programming dual cell memory device to store multiple data states per cell | Darlene Hamilton, Kulachet Tanpairoj, Yi He | 2005-10-18 |
| 6901010 | Erase method for a dual bit memory cell | Darlene Hamilton, Eric M. Ajimine, Binh Quang Le, Ken Tanpairoj | 2005-05-31 |
| 6822909 | Method of controlling program threshold voltage distribution of a dual cell memory device | Darlene Hamilton, Mark Randolph, Edward Franklin Runnion, Kulachet Tanpairoj | 2004-11-23 |
| 6813752 | Method of determining charge loss activation energy of a memory array | Darlene Hamilton, Wei Zheng, Mark Randolph, Kulachet Tanpairoj | 2004-11-02 |
| 6791880 | Non-volatile memory read circuit with end of life simulation | Kazuhiro Kurihara, Binh Quang Le, Pau-Ling Chen, Darlene Hamilton | 2004-09-14 |
| 6778442 | Method of dual cell memory device operation for improved end-of-life read margin | Darlene Hamilton, Kulachet Tanpairoj, Alykhan Madhani, Mimi Lee | 2004-08-17 |
| 6775187 | Method of programming a dual cell memory device | Darlene Hamilton, Edward Franklin Runnion, Kulachet Tanpairoj | 2004-08-10 |
| 6771545 | Method for reading a non-volatile memory cell adjacent to an inactive region of a non-volatile memory cell array | Eric M. Ajimine, Darlene Hamilton, Pauling Chen, Ming-Huei Shieh, Mark Randolph +2 more | 2004-08-03 |
| 6768673 | Method of programming and reading a dual cell memory device | Darlene Hamilton, Kulachet Tanpairoj, Mimi Lee, Alykhan Madhani, Yi He | 2004-07-27 |
| 6436768 | Source drain implant during ONO formation for improved isolation of SONOS devices | Jean Y. Yang, Mark T. Ramsbey, Emmanuil Lingunis, Yider Wu, Tazrien Kamal +2 more | 2002-08-20 |
| 6381550 | Method of utilizing fast chip erase to screen endurance rejects | Phuong Banh, Darlene Hamilton | 2002-04-30 |
| 5870407 | Method of screening memory cells at room temperature that would be rejected during hot temperature programming tests | Jose Hernan Hernandez, Sayan Suanya | 1999-02-09 |
| 5751633 | Method of screening hot temperature erase rejects at room temperature | Jose Hernan Hernandez, Sayan Suanya | 1998-05-12 |
| 5724365 | Method of utilizing redundancy testing to substitute for main array programming and AC speed reads | Darlene Hamilton, Jose Hernan Hernandez | 1998-03-03 |
| 4798515 | Variable nozzle area turbine vane cooling | John Howard Starkweather, William K. Koffel | 1989-01-17 |
| 4573865 | Multiple-impingement cooled structure | Raghuram J. Emani, John Howard Starkweather | 1986-03-04 |
| 4526226 | Multiple-impingement cooled structure | Raghuram J. Emani, John Howard Starkweather | 1985-07-02 |