Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7672803 | Input of test conditions and output generation for built-in self test | Darlene Hamilton, Ken Cheong Cheah | 2010-03-02 |
| 7415646 | Page—EXE erase algorithm for flash memory | Darlene Hamilton, Ken Cheong Cheah | 2008-08-19 |
| 7284167 | Automated tests for built-in self test | Darlene Hamilton, Ken Cheong Cheah, Kendra Nguyen, Xin Guo | 2007-10-16 |
| 6967873 | Memory device and method using positive gate stress to recover overerased cell | Darlene Hamilton, Zhizheng Liu, Mark Randolph, Yi He, Edward Hsia +2 more | 2005-11-22 |
| 6778442 | Method of dual cell memory device operation for improved end-of-life read margin | Darlene Hamilton, Edward Hsia, Kulachet Tanpairoj, Alykhan Madhani | 2004-08-17 |
| 6768673 | Method of programming and reading a dual cell memory device | Edward Hsia, Darlene Hamilton, Kulachet Tanpairoj, Alykhan Madhani, Yi He | 2004-07-27 |