CW

Connie P. Wang

AM AMD: 15 patents #735 of 9,279Top 8%
Applied Materials: 10 patents #1,290 of 7,310Top 20%
SL Spansion Llc.: 9 patents #102 of 769Top 15%
VA Varian Semiconductor Equipment Associates: 8 patents #102 of 513Top 20%
Cypress Semiconductor: 3 patents #568 of 1,852Top 35%
MR Monterey Research: 2 patents #7 of 54Top 15%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
TI Texas Instruments: 1 patents #7,357 of 12,488Top 60%
📍 Irvine, CA: #79 of 6,241 inventorsTop 2%
🗺 California: #5,467 of 386,348 inventorsTop 2%
Overall (All Time): #36,813 of 4,157,543Top 1%
62
Patents All Time

Issued Patents All Time

Showing 51–62 of 62 patents

Patent #TitleCo-InventorsDate
D562890 Pen Kung Hua Lin 2008-02-26
7335594 Method for manufacturing a memory device having a nanocrystal charge storage region Zoran Krivokapic, Suzette K. Pangrle, Jinsong Yin 2008-02-26
7309650 Memory device having a nanocrystal charge storage region and method Lu You, Zoran Krivokapic, Paul R. Besser, Suzette K. Pangrle 2007-12-18
7217660 Method for manufacturing a semiconductor component that inhibits formation of wormholes Paul R. Besser, Jinsong Yin, Hieu Pham, Minh Van Ngo 2007-05-15
7033940 Method of forming composite barrier layers with controlled copper interface surface roughness Amit P. Marathe, Christy Mei-Chu Woo, Paul L. King 2006-04-25
6979642 Method of self-annealing conductive lines that separates grain size effects from alloy mobility Matthew S. Buynoski, Paul R. Besser, Minh Quoc Tran 2005-12-27
6979625 Copper interconnects with metal capping layer and selective copper alloys Christy Mei-Chu Woo, Darrell M. Erb 2005-12-27
6952052 Cu interconnects with composite barrier layers for wafer-to-wafer uniformity Amit P. Marathe, Christy Mei-Chu Woo 2005-10-04
6943096 Semiconductor component and method of manufacture Suzette K. Pangrle, Sergey Lopatin 2005-09-13
6927162 Method of forming a contact in a semiconductor device with formation of silicide prior to plasma treatment Wen Yu, Jinsong Yin, Paul R. Besser, Keizaburo Yoshie 2005-08-09
6509267 Method of forming low resistance barrier on low k interconnect with electrolessly plated copper seed layer Christy Mei-Chu Woo, Suzette K. Pangrle 2003-01-21
6506668 Utilization of annealing enhanced or repaired seed layer to improve copper interconnect reliability Christy Mei-Chu Woo, Steve Avanzino 2003-01-14