Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10458777 | Polarization measurements of metrology targets and corresponding target designs | Eran Amit, Barry Loevsky, Andrew V. Hill, Amnon Manassen, Vladimir Levinski +1 more | 2019-10-29 |
| 10415963 | Estimating and eliminating inter-cell process variation inaccuracy | Tal Marciano, Eran Amit, Barak Bringoltz, Amit Shaked | 2019-09-17 |
| 10303835 | Method and apparatus for direct self assembly in target design and production | Eran Amit, Raviv Yohanan, Tal Itzkovich, Roie Volkovich, DongSub Choi | 2019-05-28 |
| 10242290 | Method, system, and user interface for metrology target characterization | Inna Tarshish-Shapir, Yoel Feler, Anat Marchelli, Berta Dinu, Vladimir Levinski +4 more | 2019-03-26 |