Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10458777 | Polarization measurements of metrology targets and corresponding target designs | Eran Amit, Andrew V. Hill, Amnon Manassen, Nuriel Amir, Vladimir Levinski +1 more | 2019-10-29 |
| 10352766 | Focusing modules and methods | Ari Krauss, Avraham Bakal | 2019-07-16 |
| 10209183 | Scatterometry system and method for generating non-overlapping and non-truncated diffraction images | Tzahi Grunzweig, Andrew V. Hill | 2019-02-19 |
| 10190979 | Metrology imaging targets having reflection-symmetric pairs of reflection-asymmetric structures | Amnon Manassen, Yuri Paskover, Daria Negri | 2019-01-29 |