Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10379449 | Identifying process variations during product manufacture | Nadav Gutman, Claire E. Staniunas, Tal Marciano, Nimrod Shuall | 2019-08-13 |
| 10365230 | Scatterometry overlay based on reflection peak locations | Eran Amit | 2019-07-30 |
| 10209183 | Scatterometry system and method for generating non-overlapping and non-truncated diffraction images | Andrew V. Hill, Barry Loevsky | 2019-02-19 |