Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10415963 | Estimating and eliminating inter-cell process variation inaccuracy | Eran Amit, Barak Bringoltz, Nuriel Amir, Amit Shaked | 2019-09-17 |
| 10379449 | Identifying process variations during product manufacture | Tzahi Grunzweig, Nadav Gutman, Claire E. Staniunas, Nimrod Shuall | 2019-08-13 |
| 10317198 | Three-dimensional mapping of a wafer | Vincent Immer, Naomi Ittah | 2019-06-11 |
| 10203200 | Analyzing root causes of process variation in scatterometry metrology | Michael Adel, Mark Ghinovker, Barak Bringoltz, Dana Klein, Tal Itzkovich +2 more | 2019-02-12 |