Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10303835 | Method and apparatus for direct self assembly in target design and production | Eran Amit, Raviv Yohanan, Nuriel Amir, Roie Volkovich, DongSub Choi | 2019-05-28 |
| 10203200 | Analyzing root causes of process variation in scatterometry metrology | Tal Marciano, Michael Adel, Mark Ghinovker, Barak Bringoltz, Dana Klein +2 more | 2019-02-12 |