Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10415963 | Estimating and eliminating inter-cell process variation inaccuracy | Tal Marciano, Eran Amit, Nuriel Amir, Amit Shaked | 2019-09-17 |
| 10261014 | Near field metrology | Noam Sapiens, Joel Seligson, Vladimir Levinski, Daniel Kandel, Yoel Feler +2 more | 2019-04-16 |
| 10234280 | Reflection symmetric scatterometry overlay targets and methods | Daniel Kandel | 2019-03-19 |
| 10203200 | Analyzing root causes of process variation in scatterometry metrology | Tal Marciano, Michael Adel, Mark Ghinovker, Dana Klein, Tal Itzkovich +2 more | 2019-02-12 |