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Method to improve reliability of replacement gate device |
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Method to improve reliability of replacement gate device |
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Method to improve reliability of replacement gate device |
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Replacement gate structure with low-K sidewall spacer for semiconductor devices |
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Method to improve reliability of replacement gate device |
Takashi Ando, Eduard A. Cartier, Vijay Narayanan |
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Gate structures for transistor devices for CMOS applications and products |
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Methods of scaling thickness of a gate dielectric structure, methods of forming an integrated circuit, and integrated circuits |
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2016-05-24 |
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Low threshold voltage CMOS device |
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Methods of forming replacement gate structures for transistors and the resulting devices |
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Field effect transistor and method of fabrication |
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