Issued Patents 2011
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8026482 | Charged particle beam apparatus and control method therefor | Hiromasa Yamanashi, Sayaka Tanimoto, Yasunari Souda, Osamu Nasu | 2011-09-27 |
| 8026481 | Charged particle apparatus, scanning electron microscope, and sample inspection method | Tomoyasu Shojo, Atsuko Fukada, Noritsugu Takahashi | 2011-09-27 |
| 7989782 | Apparatus and method for specimen fabrication | Satoshi Tomimatsu, Miyuki Takahashi, Hiroyasu Shichi | 2011-08-02 |
| 7956324 | Charged particle beam apparatus for forming a specimen image | Noritsugu Takahashi, Hideo Todokoro, Mitsugu Sato | 2011-06-07 |
| 7952083 | Ion beam system and machining method | Hiroyasu Shichi, Yoshinori Nakayama, Masaki Hasegawa, Satoshi Tomimatsu | 2011-05-31 |
| 7897936 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Eiichi Seya +3 more | 2011-03-01 |
| 7888639 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Yasuhiro Mitsui, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2011-02-15 |
| 7884325 | Electron beam measurement apparatus | Yasunari Sohda, Shoji Hotta, Shinji Okazaki | 2011-02-08 |
| 7875849 | Electron beam apparatus and electron beam inspection method | Tomoyasu Shojo, Mitsugu Sato, Atsuko Fukada, Naomasa Suzuki, Ichiro Tachibana | 2011-01-25 |