Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8074293 | Defective product inspection apparatus, probe positioning method and probe moving method | Eiichi Hazaki, Takashi Furukawa, Hiroshi Yanagita, Susumu Kato, Osamu Satou +2 more | 2011-12-06 |
| 7888639 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Hidemi Koike, Satoshi Tomimatsu, Hiroyasu Shichi +2 more | 2011-02-15 |