Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8074293 | Defective product inspection apparatus, probe positioning method and probe moving method | Eiichi Hazaki, Yasuhiro Mitsui, Takashi Furukawa, Susumu Kato, Osamu Satou +2 more | 2011-12-06 |
| 8040552 | Variable data image generating device, variable data image forming system and computer readable storage medium | — | 2011-10-18 |
| 7982271 | Semiconductor device | Naozumi Morino, Atsushi Hiraiwa, Kazutoshi Oku, Toshiaki Ito, Motoshige Igarashi +3 more | 2011-07-19 |