Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8080789 | Sample dimension measuring method and scanning electron microscope | Tadashi Otaka, Hiroki Kawada, Ritsuo Fukaya, Makoto Ezumi | 2011-12-20 |
| 8026482 | Charged particle beam apparatus and control method therefor | Muneyuki Fukuda, Hiromasa Yamanashi, Sayaka Tanimoto, Yasunari Souda | 2011-09-27 |