Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8080789 | Sample dimension measuring method and scanning electron microscope | Osamu Nasu, Hiroki Kawada, Ritsuo Fukaya, Makoto Ezumi | 2011-12-20 |
| 7910886 | Sample dimension measuring method and scanning electron microscope | Hiroki Kawada, Takashi Iizumi | 2011-03-22 |