Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8080789 | Sample dimension measuring method and scanning electron microscope | Osamu Nasu, Tadashi Otaka, Hiroki Kawada, Makoto Ezumi | 2011-12-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8080789 | Sample dimension measuring method and scanning electron microscope | Osamu Nasu, Tadashi Otaka, Hiroki Kawada, Makoto Ezumi | 2011-12-20 |