Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8080789 | Sample dimension measuring method and scanning electron microscope | Osamu Nasu, Tadashi Otaka, Ritsuo Fukaya, Makoto Ezumi | 2011-12-20 |
| 8022356 | Sample and method for evaluating resolution of scanning electron microscope, and electron scanning microscope | Mayuka Oosaki, Chie Shishido, Maki Tanaka | 2011-09-20 |
| 8003940 | Tool-to-tool matching control method and its system for scanning electron microscope | Mayuka Oosaki, Chie Shishido, Tatsuya Maeda | 2011-08-23 |
| 7910886 | Sample dimension measuring method and scanning electron microscope | Takashi Iizumi, Tadashi Otaka | 2011-03-22 |