DG

David Grigg

VI Veeco Instruments: 6 patents #30 of 323Top 10%
DI Digital Instruments: 5 patents #3 of 25Top 15%
PS Photothermal Spectroscopy: 5 patents #5 of 8Top 65%
University of California: 3 patents #2,984 of 18,278Top 20%
ZY Zygo: 2 patents #34 of 99Top 35%
BN Bruker Nano: 1 patents #76 of 148Top 55%
Overall (All Time): #229,457 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12405215 Asymmetric quadrature interferometry for thin film interference suppression in optical photothermal infrared spectroscopy Craig Prater, Derek Decker 2025-09-02
12372401 Method and apparatus for high performance wide field photothermal imaging and spectroscopy Craig Prater, Derek Decker 2025-07-29
12276603 Asymmetric interferometric optical photothermal infrared spectroscopy Craig Prater, Derek Decker 2025-04-15
11774354 Interferometric optical photothermal infrared spectroscopy Craig Prater, Derek Decker 2023-10-03
11480518 Asymmetric interferometric optical photothermal infrared spectroscopy Craig Prater, Derek Decker 2022-10-25
8087288 Scanning stylus atomic force microscope with cantilever tracking and optical access Craig Prater, James Massie, Virgil B. Elings, Paul K. Hansma, Barney Drake 2012-01-03
7501615 Flexure assembly for a scanner Jason Cleveland 2009-03-10
7102761 Scanning interferometry Xavier Colonna De Lega, Peter De Groot 2006-09-05
7002138 Flexure assembly for a scanner Jason Cleveland 2006-02-21
6822745 Optical systems for measuring form and geometric dimensions of precision engineered parts Peter De Groot, Xavier Colonna De Lega, James F. Biegen 2004-11-23
6720551 Flexure assembly for a scanner Jason Cleveland 2004-04-13
6410907 Flexure assembly for a scanner Jason Cleveland 2002-06-25
6323483 High bandwidth recoiless microactuator Jason Cleveland 2001-11-27
6246052 Flexure assembly for a scanner Jason Cleveland 2001-06-12
6032518 Scanning stylus atomic force microscope with cantilever tracking and optical access Craig Prater, James Massie, Virgil B. Elings, Paul K. Hansma, Barney Drake 2000-03-07
5714682 Scanning stylus atomic force microscope with cantilever tracking and optical access Craig Prater, James Massie, Virgil B. Elings, Paul K. Hansma, Barney Drake 1998-02-03
5705814 Scanning probe microscope having automatic probe exchange and alignment James M. Young, Craig Prater, Charles Meyer, William H. Hertzog, John A. Gurley +1 more 1998-01-06
5560244 Scanning stylus atomic force microscope with cantilever tracking and optical access Craig Prater, James Massie, Virgil B. Elings, Paul K. Hansma, Barney Drake 1996-10-01
5463897 Scanning stylus atomic force microscope with cantilever tracking and optical access Craig Prater, James Massie, Virgil B. Elings, Paul K. Hansma, Barney Drake 1995-11-07