Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8045175 | Equal-path interferometer | Peter De Groot, Leslie L. Deck, Chris L. Koliopoulos | 2011-10-25 |
| 7751064 | Interference objective for annular test surfaces | Jan Liesener | 2010-07-06 |
| 6822745 | Optical systems for measuring form and geometric dimensions of precision engineered parts | Peter De Groot, Xavier Colonna De Lega, David Grigg | 2004-11-23 |
| 5724134 | Calibration standard for optical gap measuring tools | Peter De Groot, Leslie L. Deck, Robert A. Smythe | 1998-03-03 |
| 5390023 | Interferometric method and apparatus to measure surface topography | — | 1995-02-14 |
| 4948253 | Interferometric surface profiler for spherical surfaces | — | 1990-08-14 |
| 4869593 | Interferometric surface profiler | — | 1989-09-26 |
| 4820049 | Coating and method for testing plano and spherical wavefront producing optical surfaces and systems having a broad range of reflectivities | — | 1989-04-11 |
| 4732483 | Interferometric surface profiler | — | 1988-03-22 |