Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9581437 | Interferometric non-contact optical probe and measurement | Artur Olszak, Piotr Szwaykowski | 2017-02-28 |
| 9068904 | System and method for non-contact metrology of surfaces | Robert E. Parks, Peng Su, James Burge, Roger P Angel | 2015-06-30 |
| 7405833 | Method for calibration and removal of wavefront errors | Donald S. Battistoni | 2008-07-29 |
| 5724134 | Calibration standard for optical gap measuring tools | Peter De Groot, James F. Biegen, Leslie L. Deck | 1998-03-03 |
| 4509858 | Compact, linear measurement interferometer with zero abbe error | Joachim Bunkenburg, Gunnar D. Richardson | 1985-04-09 |