Issued Patents All Time
Showing 1–25 of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10816408 | Wavelength shifting in spectrally-controlled interferometry | Chase Salsbury | 2020-10-27 |
| 10746537 | Radius-of-curvature measurement by spectrally-controlled interferometry | — | 2020-08-18 |
| 10473451 | Measuring the position of objects in space | — | 2019-11-12 |
| 10422700 | Optical alignment based on spectrally-controlled interferometry | — | 2019-09-24 |
| 9696211 | Time-multiplexed spectrally controlled interferometry | — | 2017-07-04 |
| 9618320 | Heterodyne spectrally controlled interferometry | — | 2017-04-11 |
| 9581437 | Interferometric non-contact optical probe and measurement | Robert A. Smythe, Piotr Szwaykowski | 2017-02-28 |
| 9581428 | Time-multiplexed spectrally controlled interferometry | — | 2017-02-28 |
| 8810884 | Light sources for spectrally controlled interferometry | — | 2014-08-19 |
| 8675205 | Optical coherence tomography using spectrally controlled interferometry | — | 2014-03-18 |
| 8422026 | Spectrally controllable light sources in interferometry | — | 2013-04-16 |
| 7864380 | Slide-borne imaging instructions | Michael R. Descour, Andrew Lowe | 2011-01-04 |
| 7864379 | Multi-spectral whole-slide scanner | Chen Liang | 2011-01-04 |
| 7864369 | Large-area imaging by concatenation with array microscope | Chen Liang | 2011-01-04 |
| 7755841 | Liquid-lens variable-control optics in array microscope | Todd R. Christenson, Michael R. Descour, Chen Liang | 2010-07-13 |
| 7482566 | Equalization for a multi-axis imaging system | — | 2009-01-27 |
| 7388714 | Independent focus compensation for a multi-axis imaging system | Chen Liang | 2008-06-17 |
| 7330574 | Best-focus estimation by lateral scanning | — | 2008-02-12 |
| 7193775 | EPI-illumination system for an array microscope | Chen Liang | 2007-03-20 |
| 7130115 | Multi-mode scanning imaging system | Chen Liang, Michael R. Descour | 2006-10-31 |
| 7034317 | Method and apparatus for limiting scanning imaging array data to characteristics of interest | Chen Liang | 2006-04-25 |
| 7019895 | Microscope stage providing improved optical performance | William C. Russum | 2006-03-28 |
| 6987570 | Reference signal for stitching of interferometric profiles | Joanna Schmit | 2006-01-17 |
| 6987259 | Imaging system with an integrated source and detector array | Chen Liang | 2006-01-17 |
| 6958464 | Equalization for a multi-axis imaging system | Chen Liang | 2005-10-25 |