Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10488391 | Neural circuit probe | Paul K. Hansma, Kenneth S. Kosik, Luke S. K. Theogarajan, Daniel Bridges, Connor Randall +1 more | 2019-11-26 |
| 8087288 | Scanning stylus atomic force microscope with cantilever tracking and optical access | Craig Prater, James Massie, David Grigg, Virgil B. Elings, Paul K. Hansma | 2012-01-03 |
| 7966866 | Methods and instruments for materials testing | Paul K. Hansma, Douglas J. Rehn, Jonathan Adams, Jason Lulejian | 2011-06-28 |
| 6871527 | Measurement head for atomic force microscopy and other applications | Paul K. Hansma, James A. Thompson, Johannes Kindt, David K. Hale | 2005-03-29 |
| 6032518 | Scanning stylus atomic force microscope with cantilever tracking and optical access | Craig Prater, James Massie, David Grigg, Virgil B. Elings, Paul K. Hansma | 2000-03-07 |
| 5714682 | Scanning stylus atomic force microscope with cantilever tracking and optical access | Craig Prater, James Massie, David Grigg, Virgil B. Elings, Paul K. Hansma | 1998-02-03 |
| 5560244 | Scanning stylus atomic force microscope with cantilever tracking and optical access | Craig Prater, James Massie, David Grigg, Virgil B. Elings, Paul K. Hansma | 1996-10-01 |
| 5463897 | Scanning stylus atomic force microscope with cantilever tracking and optical access | Craig Prater, James Massie, David Grigg, Virgil B. Elings, Paul K. Hansma | 1995-11-07 |
| RE34708 | Scanning ion conductance microscope | Paul K. Hansma | 1994-08-30 |
| RE34489 | Atomic force microscope with optional replaceable fluid cell | Paul K. Hansma | 1993-12-28 |
| 4935634 | Atomic force microscope with optional replaceable fluid cell | Paul K. Hansma | 1990-06-19 |
| 4924091 | Scanning ion conductance microscope | Paul K. Hansma | 1990-05-08 |