Issued Patents All Time
Showing 25 most recent of 54 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8087288 | Scanning stylus atomic force microscope with cantilever tracking and optical access | Craig Prater, James Massie, David Grigg, Paul K. Hansma, Barney Drake | 2012-01-03 |
| 6642517 | Method and apparatus for atomic force microscopy | Lucien P. Ghislain | 2003-11-04 |
| RE37560 | Scan control for scanning probe microscopes | — | 2002-02-26 |
| RE37203 | Feedback control for scanning tunnel microscopes | John A. Gurley | 2001-06-05 |
| 6172506 | Capacitance atomic force microscopes and methods of operating such microscopes | Dennis M. Adderton | 2001-01-09 |
| 6032518 | Scanning stylus atomic force microscope with cantilever tracking and optical access | Craig Prater, James Massie, David Grigg, Paul K. Hansma, Barney Drake | 2000-03-07 |
| RE36488 | Tapping atomic force microscope with phase or frequency detection | John A. Gurley | 2000-01-11 |
| 6008489 | Method for improving the operation of oscillating mode atomic force microscopes | Sergei Magonov | 1999-12-28 |
| 5939709 | Scanning probe optical microscope using a solid immersion lens | Lucien P. Ghislain | 1999-08-17 |
| 5898106 | Method and apparatus for obtaining improved vertical metrology measurements | Kenneth Babcock, John A. Gurley, Kevin Kjoller | 1999-04-27 |
| 5874734 | Atomic force microscope for measuring properties of dielectric and insulating layers | Dennis M. Adderton, Dror Sarid | 1999-02-23 |
| 5866807 | Method and apparatus for measuring mechanical properties on a small scale | Jeffrey R. Elings, Christopher Schmitt | 1999-02-02 |
| 5714682 | Scanning stylus atomic force microscope with cantilever tracking and optical access | Craig Prater, James Massie, David Grigg, Paul K. Hansma, Barney Drake | 1998-02-03 |
| 5705814 | Scanning probe microscope having automatic probe exchange and alignment | James M. Young, Craig Prater, David Grigg, Charles Meyer, William H. Hertzog +1 more | 1998-01-06 |
| 5560244 | Scanning stylus atomic force microscope with cantilever tracking and optical access | Craig Prater, James Massie, David Grigg, Paul K. Hansma, Barney Drake | 1996-10-01 |
| 5557156 | Scan control for scanning probe microscopes | — | 1996-09-17 |
| 5553487 | Methods of operating atomic force microscopes to measure friction | — | 1996-09-10 |
| 5519212 | Tapping atomic force microscope with phase or frequency detection | John A. Gurley | 1996-05-21 |
| 5463897 | Scanning stylus atomic force microscope with cantilever tracking and optical access | Craig Prater, James Massie, David Grigg, Paul K. Hansma, Barney Drake | 1995-11-07 |
| 5418363 | Scanning probe microscope using stored data for vertical probe positioning | John A. Gurley | 1995-05-23 |
| 5415027 | Jumping probe microscope | John A. Gurley | 1995-05-16 |
| 5412980 | Tapping atomic force microscope | John A. Gurley | 1995-05-09 |
| 5400647 | Methods of operating atomic force microscopes to measure friction | — | 1995-03-28 |
| 5329808 | Atomic force microscope | John A. Gurley | 1994-07-19 |
| 5308974 | Scanning probe microscope using stored data for vertical probe positioning | John A. Gurley | 1994-05-03 |