Issued Patents All Time
Showing 25 most recent of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE37203 | Feedback control for scanning tunnel microscopes | Virgil B. Elings | 2001-06-05 |
| RE36488 | Tapping atomic force microscope with phase or frequency detection | Virgil B. Elings | 2000-01-11 |
| 5898106 | Method and apparatus for obtaining improved vertical metrology measurements | Kenneth Babcock, Virgil B. Elings, Kevin Kjoller | 1999-04-27 |
| 5705814 | Scanning probe microscope having automatic probe exchange and alignment | James M. Young, Craig Prater, David Grigg, Charles Meyer, William H. Hertzog +1 more | 1998-01-06 |
| 5519212 | Tapping atomic force microscope with phase or frequency detection | Virgil B. Elings | 1996-05-21 |
| 5418363 | Scanning probe microscope using stored data for vertical probe positioning | Virgil B. Elings | 1995-05-23 |
| 5415027 | Jumping probe microscope | Virgil B. Elings | 1995-05-16 |
| 5412980 | Tapping atomic force microscope | Virgil B. Elings | 1995-05-09 |
| 5329808 | Atomic force microscope | Virgil B. Elings | 1994-07-19 |
| 5314254 | Stiffness enhancer for movable stage assembly | Frank Yashar, Charles Meyer | 1994-05-24 |
| 5308974 | Scanning probe microscope using stored data for vertical probe positioning | Virgil B. Elings | 1994-05-03 |
| 5306919 | Positioning device for scanning probe microscopes | Virgil B. Elings | 1994-04-26 |
| 5266801 | Jumping probe microscope | Virgil B. Elings | 1993-11-30 |
| 5253516 | Atomic force microscope for small samples having dual-mode operating capability | Virgil B. Elings | 1993-10-19 |
| 5237859 | Atomic force microscope | Virgil B. Elings, Peter Maivald | 1993-08-24 |
| RE34331 | Feedback control for scanning tunnel microscopes | Virgil B. Elings | 1993-08-03 |
| 5229606 | Jumping probe microscope | Virgil B. Elings | 1993-07-20 |
| 5224376 | Atomic force microscope | Virgil B. Elings, Peter Maivald | 1993-07-06 |
| 5204531 | Method of adjusting the size of the area scanned by a scanning probe | Virgil B. Elings | 1993-04-20 |
| 5198715 | Scanner for scanning probe microscopes having reduced Z-axis non-linearity | Virgil B. Elings | 1993-03-30 |
| 5189906 | Compact atomic force microscope | Virgil B. Elings, Dror Sarid | 1993-03-02 |
| 5077473 | Drift compensation for scanning probe microscopes using an enhanced probe positioning system | Virgil B. Elings, Mark R. Rodgers | 1991-12-31 |
| 5066858 | Scanning tunneling microscopes with correction for coupling effects | Virgil B. Elings | 1991-11-19 |
| 5051646 | Method of driving a piezoelectric scanner linearly with time | Virgil B. Elings | 1991-09-24 |
| 5025658 | Compact atomic force microscope | Virgil B. Elings, Dror Sarid | 1991-06-25 |