John A. Gurley — 27 Patents at Digital Instruments

John A. Gurley has been granted 27 US patents while listed as an inventor at Digital Instruments. The first was granted in 1989 and the most recent in June 2001. John A. Gurley ranks #142,059 of 4,157,543 US inventors in our database (top 3.4%). Patent records list John A. Gurley in Lompoc, CA, US.

Issued Patents All Time

Showing 1–25 of 27 patents

Patent #	Title	Co-Inventors	Date
RE37203	Feedback control for scanning tunnel microscopes	Virgil B. Elings	2001-06-05
RE36488	Tapping atomic force microscope with phase or frequency detection	Virgil B. Elings	2000-01-11
5898106	Method and apparatus for obtaining improved vertical metrology measurements	Kenneth Babcock, Virgil B. Elings, Kevin Kjoller	1999-04-27
5705814	Scanning probe microscope having automatic probe exchange and alignment	James M. Young, Craig Prater, David Grigg, Charles Meyer, William H. Hertzog +1 more	1998-01-06
5519212	Tapping atomic force microscope with phase or frequency detection	Virgil B. Elings	1996-05-21
5418363	Scanning probe microscope using stored data for vertical probe positioning	Virgil B. Elings	1995-05-23
5415027	Jumping probe microscope	Virgil B. Elings	1995-05-16
5412980	Tapping atomic force microscope	Virgil B. Elings	1995-05-09
5329808	Atomic force microscope	Virgil B. Elings	1994-07-19
5314254	Stiffness enhancer for movable stage assembly	Frank Yashar, Charles Meyer	1994-05-24
5308974	Scanning probe microscope using stored data for vertical probe positioning	Virgil B. Elings	1994-05-03
5306919	Positioning device for scanning probe microscopes	Virgil B. Elings	1994-04-26
5266801	Jumping probe microscope	Virgil B. Elings	1993-11-30
5253516	Atomic force microscope for small samples having dual-mode operating capability	Virgil B. Elings	1993-10-19
5237859	Atomic force microscope	Virgil B. Elings, Peter Maivald	1993-08-24
RE34331	Feedback control for scanning tunnel microscopes	Virgil B. Elings	1993-08-03
5229606	Jumping probe microscope	Virgil B. Elings	1993-07-20
5224376	Atomic force microscope	Virgil B. Elings, Peter Maivald	1993-07-06
5204531	Method of adjusting the size of the area scanned by a scanning probe	Virgil B. Elings	1993-04-20
5198715	Scanner for scanning probe microscopes having reduced Z-axis non-linearity	Virgil B. Elings	1993-03-30
5189906	Compact atomic force microscope	Virgil B. Elings, Dror Sarid	1993-03-02
5077473	Drift compensation for scanning probe microscopes using an enhanced probe positioning system	Virgil B. Elings, Mark R. Rodgers	1991-12-31
5066858	Scanning tunneling microscopes with correction for coupling effects	Virgil B. Elings	1991-11-19
5051646	Method of driving a piezoelectric scanner linearly with time	Virgil B. Elings	1991-09-24
5025658	Compact atomic force microscope	Virgil B. Elings, Dror Sarid	1991-06-25

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John A. Gurley — 27 Patents

Issued Patents All Time

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