Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Scanning probe microscope having automatic probe exchange and alignment

Scanning probe microscope having automatic probe exchange and alignment

US Patent 5705814 · Granted Jan 6, 1998

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Autofluorescence enhanced photothermal infrared spectroscopy2025
Automated spectroscopic analysis of micron-scale microplastic particles with opt2025
Asymmetric quadrature interferometry for thin film interference suppression in o2025
Asymmetric quadrature interferometry for thin film interference suppression in o2025
Wide area optical photothermal infrared spectroscopy2025
Method and apparatus for fiber optic photothermal imaging and spectroscopy2025
Method and apparatus for high performance wide field photothermal imaging and sp2025
Method and apparatus for high performance wide field photothermal imaging and sp2025
Method and apparatus for improved composite multi-wavelength photothermal infrar2025
Asymmetric interferometric optical photothermal infrared spectroscopy2025
Asymmetric interferometric optical photothermal infrared spectroscopy2025
Method and apparatus for enhanced photo-thermal imaging and spectroscopy2025